{"title":"Nuclear dose rate, total dose and neutron radiation testing of COTS devices","authors":"S.G. Mulford, D. Brown, A. L. McMaster","doi":"10.1109/REDW.2002.1045545","DOIUrl":null,"url":null,"abstract":"A compendium of radiation data for commercial off-the-shelf (COTS) devices is presented for the narrow pulse gamma dose rate, total dose gamma and neutron environments. The devices range from power MOSFETs to microprocessors and controllers. Most of the testing was performed to determine functional survivability.","PeriodicalId":135340,"journal":{"name":"IEEE Radiation Effects Data Workshop","volume":"278 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2002-12-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Radiation Effects Data Workshop","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/REDW.2002.1045545","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 3
Abstract
A compendium of radiation data for commercial off-the-shelf (COTS) devices is presented for the narrow pulse gamma dose rate, total dose gamma and neutron environments. The devices range from power MOSFETs to microprocessors and controllers. Most of the testing was performed to determine functional survivability.
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