Combined molding package (proximity sensor)

Y. F. Lee, C. Kum
{"title":"Combined molding package (proximity sensor)","authors":"Y. F. Lee, C. Kum","doi":"10.1109/IEMT.2012.6521787","DOIUrl":null,"url":null,"abstract":"Proximity sensors, which are designed to detect the presence of nearby objects without any physical contact. Proximity sensor basically employ an Infra Red LED transceiver and Light receiver to achieve proximity detection purpose. Existing proximity sensors comprise of 1 Infra red LED chip and 1 light receiver chip. This 2 separate chips setup has disadvantages of occupying more space and high assembly cost which does not meet the requirement for future application in smart phone and tablet PC Many current processes produce optical proximity sensors with poor optical isolation and unfavorable noise (e.g., light leakage) between the light emitter and light detector dies, among other poor performance characteristics. Furthermore, current molding processes utilize slow and inefficient human-operated manual casting methods that produce low and inconsistent manufacturing yields. This paper will present an innovative method of combining Infra red LED chip and receiver chip into 1 package with enhanced infra red shielding capability that keeping cross talk to extremely low level. The paper also elaborate importance of using FEA method in material selection and series of evaluation to accomplish development of combine molding package (patent filed by Carsem).","PeriodicalId":315408,"journal":{"name":"2012 35th IEEE/CPMT International Electronics Manufacturing Technology Conference (IEMT)","volume":"22 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2012-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2012 35th IEEE/CPMT International Electronics Manufacturing Technology Conference (IEMT)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IEMT.2012.6521787","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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Abstract

Proximity sensors, which are designed to detect the presence of nearby objects without any physical contact. Proximity sensor basically employ an Infra Red LED transceiver and Light receiver to achieve proximity detection purpose. Existing proximity sensors comprise of 1 Infra red LED chip and 1 light receiver chip. This 2 separate chips setup has disadvantages of occupying more space and high assembly cost which does not meet the requirement for future application in smart phone and tablet PC Many current processes produce optical proximity sensors with poor optical isolation and unfavorable noise (e.g., light leakage) between the light emitter and light detector dies, among other poor performance characteristics. Furthermore, current molding processes utilize slow and inefficient human-operated manual casting methods that produce low and inconsistent manufacturing yields. This paper will present an innovative method of combining Infra red LED chip and receiver chip into 1 package with enhanced infra red shielding capability that keeping cross talk to extremely low level. The paper also elaborate importance of using FEA method in material selection and series of evaluation to accomplish development of combine molding package (patent filed by Carsem).
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组合成型封装(接近传感器)
近距离传感器,设计用于检测附近物体的存在,而无需任何物理接触。接近传感器基本上采用红外线LED收发器和光接收器来达到接近检测的目的。现有的接近传感器由1个红外LED芯片和1个光接收芯片组成。这种两个独立的芯片设置的缺点是占用更多的空间和组装成本高,不符合未来在智能手机和平板电脑中的应用要求。目前许多工艺生产的光学接近传感器具有较差的光隔离和光探测器芯片之间的不利噪声(例如漏光),以及其他较差的性能特征。此外,目前的成型工艺利用缓慢和低效的人工操作的手工铸造方法,产生低和不一致的制造产量。本文将提出一种创新的方法,将红外LED芯片和接收器芯片结合到一个封装中,增强红外屏蔽能力,使串扰保持在极低的水平。本文还阐述了采用有限元分析方法进行材料选择和一系列评价的重要性,以完成组合式模压包的开发(Carsem专利申请)。
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