{"title":"Characteristics of CMOSFETs with sputter-deposited W/TiN stack gate","authors":"D. Lee, S. Joo, G. Lee, J. Moon, T. Shim, J. lee","doi":"10.1109/VLSIT.1995.520886","DOIUrl":null,"url":null,"abstract":"W/TiN stack gate has been investigated as a new gate electrode in ULSI CMOSFETs. With the combination of low resistivity of W and Si-midgap workfunction of TiN, very low sheet resistance and the proper characteristics of both types of transistors could be obtained simultaneously. With the deposition of TiN film at high substrate temperature, the breakdown characteristics of gate oxide could be improved considerably. The proper condition of dry etching on this structure has been also obtained.","PeriodicalId":328379,"journal":{"name":"1995 Symposium on VLSI Technology. Digest of Technical Papers","volume":"34 6","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1995-06-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"1995 Symposium on VLSI Technology. Digest of Technical Papers","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/VLSIT.1995.520886","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 5
Abstract
W/TiN stack gate has been investigated as a new gate electrode in ULSI CMOSFETs. With the combination of low resistivity of W and Si-midgap workfunction of TiN, very low sheet resistance and the proper characteristics of both types of transistors could be obtained simultaneously. With the deposition of TiN film at high substrate temperature, the breakdown characteristics of gate oxide could be improved considerably. The proper condition of dry etching on this structure has been also obtained.
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