3.3-kV SiC MOSFET Performance and Short-Circuit Capability

Abstract

This paper compares the long-channel and short-channel 3300-V, 5-A silicon carbide (SiC) metal-oxide-semiconductor field-effect transistors (MOSFETs) manufactured by GeneSiC regarding static characteristics and short-circuit (SC) sustaining capability. Their saturation currents were measured up to 2200-V drain bias at different gate voltages. The SC withstand times of two types of devices were measured at 2200-V drain voltage and 1S-V gate voltage. Their SC test results were compared with 1200-V SiC MOSFETs from four different manufactures, which suggested that SiC MOSFETs with longer channel length should have longer sustaining times in a SC event. In addition, the device dynamic characteristic was evaluated. A comprehensive simulation program with integrated circuit emphasis (SPICE) model was developed based on the device test results.