{"title":"A Versatile 60 GHz Test Fixture","authors":"W. Oldfield","doi":"10.1109/ARFTG.1989.323932","DOIUrl":null,"url":null,"abstract":"A microstrip and co-planar waveguide test fixture which operates to 60 GHz is described and data is presented. The fixture does not require mounting blocks and can test a large variety of shapes and sizes of substrates. The fixture is useful for both scalar and vector measurement systems.","PeriodicalId":358927,"journal":{"name":"33rd ARFTG Conference Digest","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1989-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"33rd ARFTG Conference Digest","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ARFTG.1989.323932","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
A microstrip and co-planar waveguide test fixture which operates to 60 GHz is described and data is presented. The fixture does not require mounting blocks and can test a large variety of shapes and sizes of substrates. The fixture is useful for both scalar and vector measurement systems.
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