{"title":"Broadband embedded substrate noise measurement for RF/Microwave ICs","authors":"M. He, W. Eisenstadt, R. Fox","doi":"10.1109/ARFTG.2006.8361657","DOIUrl":null,"url":null,"abstract":"In this paper, a down conversion-based embedded substrate noise measurement up to 20 GHz is presented in detail. This on-chip measurement method utilizes a down conversion mixer and shows a measurement range from less than-60 dBm to greater than 2 dBm. Special test structures and measurement circuit were designed and fabricated in a BiCMOS 180nm-technology with a high-resistivity substrate. A semi-physical equivalent circuit model based on experimentally determined data is proposed and has been verified by embedded measurements. Error analysis will be reported later.","PeriodicalId":302468,"journal":{"name":"2006 68th ARFTG Conference: Microwave Measurement","volume":"74 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2006-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2006 68th ARFTG Conference: Microwave Measurement","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ARFTG.2006.8361657","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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Abstract
In this paper, a down conversion-based embedded substrate noise measurement up to 20 GHz is presented in detail. This on-chip measurement method utilizes a down conversion mixer and shows a measurement range from less than-60 dBm to greater than 2 dBm. Special test structures and measurement circuit were designed and fabricated in a BiCMOS 180nm-technology with a high-resistivity substrate. A semi-physical equivalent circuit model based on experimentally determined data is proposed and has been verified by embedded measurements. Error analysis will be reported later.
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