{"title":"Next generation environment for extremely fast test pattern generation","authors":"Gabriele Pulini, S. Hamacher","doi":"10.1109/EURDAC.1993.410671","DOIUrl":null,"url":null,"abstract":"The importance of test in ASIC and IC design is discussed, and some new design-for-test (DFT) strategies are presented. The advantages of a specific method for test vector creation and validation that tightly links two scan-test tools into the target design flow are described. These tools are a sequential, partial-scan automatic test pattern generator (ATPG) and an ATPG optimized for full-scan designs. Some customer results with these tools are presented as well.<<ETX>>","PeriodicalId":339176,"journal":{"name":"Proceedings of EURO-DAC 93 and EURO-VHDL 93- European Design Automation Conference","volume":"1 3 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1993-09-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of EURO-DAC 93 and EURO-VHDL 93- European Design Automation Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EURDAC.1993.410671","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
The importance of test in ASIC and IC design is discussed, and some new design-for-test (DFT) strategies are presented. The advantages of a specific method for test vector creation and validation that tightly links two scan-test tools into the target design flow are described. These tools are a sequential, partial-scan automatic test pattern generator (ATPG) and an ATPG optimized for full-scan designs. Some customer results with these tools are presented as well.<>
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