S. C. Witczak, Jeremiah J. Horner, James Hack, N.P. Goldstein, Paul Dudek, Brainton Song, S. Messenger, Glen E. Macejik, Thomas J. Knight
{"title":"Compendium of Single Event Effects Test Results for Selected Integrated Circuits","authors":"S. C. Witczak, Jeremiah J. Horner, James Hack, N.P. Goldstein, Paul Dudek, Brainton Song, S. Messenger, Glen E. Macejik, Thomas J. Knight","doi":"10.1109/RADECS50773.2020.9857696","DOIUrl":null,"url":null,"abstract":"Test results for single event effects due to heavy-ion irradiation are reported for more than 30 part types. Event characterization includes LET thresholds, cross-sections and os-cilloscope captures for both destructive and non-destructive events. Event rates for selected parts are estimated from the cross-section data for three orbits. These results will provide systems designers information that is critical to parts selection for space applications.","PeriodicalId":371838,"journal":{"name":"2020 20th European Conference on Radiation and Its Effects on Components and Systems (RADECS)","volume":"33 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2020-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2020 20th European Conference on Radiation and Its Effects on Components and Systems (RADECS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/RADECS50773.2020.9857696","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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Abstract
Test results for single event effects due to heavy-ion irradiation are reported for more than 30 part types. Event characterization includes LET thresholds, cross-sections and os-cilloscope captures for both destructive and non-destructive events. Event rates for selected parts are estimated from the cross-section data for three orbits. These results will provide systems designers information that is critical to parts selection for space applications.
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