Gurgen Harutunyan, S. Shoukourian, V. Vardanian, Y. Zorian
{"title":"An effective solution for building memory BIST infrastructure based on fault periodicity","authors":"Gurgen Harutunyan, S. Shoukourian, V. Vardanian, Y. Zorian","doi":"10.1109/VTS.2013.6548893","DOIUrl":null,"url":null,"abstract":"This paper introduces a new solution for building memory BIST infrastructure, based on rules of fault periodicity and regularity in test algorithms. It is proposed to describe all the periodicity and regularity rules in a form of a special Fault Periodicity Table (FPT) and March Test Template (MTT). FPT allows considering any large number of faults in one table and MTT allows obtaining March tests without using special tools for their generation.","PeriodicalId":138435,"journal":{"name":"2013 IEEE 31st VLSI Test Symposium (VTS)","volume":"21 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2013-04-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"9","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2013 IEEE 31st VLSI Test Symposium (VTS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/VTS.2013.6548893","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 9
Abstract
This paper introduces a new solution for building memory BIST infrastructure, based on rules of fault periodicity and regularity in test algorithms. It is proposed to describe all the periodicity and regularity rules in a form of a special Fault Periodicity Table (FPT) and March Test Template (MTT). FPT allows considering any large number of faults in one table and MTT allows obtaining March tests without using special tools for their generation.