Ryan Pennucci, R. Jurasek, W. Hokenmaier, L. Patrick, J. Bucci, D. Labrecque, Dave Kinney
{"title":"An analysis of an inexpensive memory test solution","authors":"Ryan Pennucci, R. Jurasek, W. Hokenmaier, L. Patrick, J. Bucci, D. Labrecque, Dave Kinney","doi":"10.1109/NATW.2018.8388866","DOIUrl":null,"url":null,"abstract":"Multi-project wafers have lowered manufacturing costs for semiconductor prototypes, yet test costs remain high, presenting a barrier for innovation in the market. We present and analyze a low-cost test strategy for memory devices.","PeriodicalId":423190,"journal":{"name":"2018 IEEE 27th North Atlantic Test Workshop (NATW)","volume":"6 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 IEEE 27th North Atlantic Test Workshop (NATW)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/NATW.2018.8388866","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
Multi-project wafers have lowered manufacturing costs for semiconductor prototypes, yet test costs remain high, presenting a barrier for innovation in the market. We present and analyze a low-cost test strategy for memory devices.
京公网安备 11010802042870号
京ICP备2023020795号-1
分享
求助内容：
应助结果提醒方式：
扫码关注我们
