{"title":"Algebraic error detection: a new approach to concurrent error detection in arithmetic circuits","authors":"R. Evans","doi":"10.1109/ASPDAC.1995.486393","DOIUrl":null,"url":null,"abstract":"We present a novel and extremely simple technique for performing concurrent error detection in arithmetic circuits such as those used in Digital Signal Processing (DSP). Our approach, called Algebraic Error Detection, employs the well known concept of time redundancy, but exploits the algebraic properties of the number representation used within the circuit to permit errors to be detected. Within certain constraints, our approach appears to be capable of detecting all errors caused by single stuck-at faults, both permanent and transient, as well as many multiple faults, and may also be applicable to existing DSP chips. We also describe two hardware systems developed to demonstrate the idea.","PeriodicalId":119232,"journal":{"name":"Proceedings of ASP-DAC'95/CHDL'95/VLSI'95 with EDA Technofair","volume":"70 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1995-08-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of ASP-DAC'95/CHDL'95/VLSI'95 with EDA Technofair","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ASPDAC.1995.486393","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
We present a novel and extremely simple technique for performing concurrent error detection in arithmetic circuits such as those used in Digital Signal Processing (DSP). Our approach, called Algebraic Error Detection, employs the well known concept of time redundancy, but exploits the algebraic properties of the number representation used within the circuit to permit errors to be detected. Within certain constraints, our approach appears to be capable of detecting all errors caused by single stuck-at faults, both permanent and transient, as well as many multiple faults, and may also be applicable to existing DSP chips. We also describe two hardware systems developed to demonstrate the idea.