Study on the distribution characteristics of the scattered current during the transmission tower being lightning struck

2017 2nd IEEE International Conference on Integrated Circuits and Microsystems (ICICM) Pub Date : 2017-11-01 DOI:10.1109/ICAM.2017.8242135

Hengzhen Li, Z. Ming, Bangfa Chen, Zhang Sihan, Dong Di

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Abstract

In order to solve the safety problem about person and equipment caused by the dispersed current during the transmission tower being lightning struck, it is necessary to study the characteristics of the dispersed current. In this paper, the dispersed current model of the tower grounding device is established in COMSOL. The distribution of the dispersed current around the tower is discussed, and the location of the test points is determined according to the simulation. Then the field experiment platform based on the lightning current generator and the dispersed current measurement system is established to measure the dispersed current. The influence of the grounding device structure on the dispersed current characteristics is discussed with the experimental data and simulation analysis. The results show that the field experiment platform can accurately measure the current density in the ground and the simulation results are consistent with the measured data. Therefore, the simulation model can be used in further study of the dispersed current situation around the grounding device. Far from the grounding electrode 4–5m, the current density decreased about 50%, 7–8m decreased by about 75%. The current density near the ground device decreases with the extension of the horizontal ground electrode, and the closer the distance to the grounding device is, the more obvious the trend is.

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输电塔被雷击时散射电流分布特性的研究

为了解决输电塔受雷击时产生的分散电流对人身和设备的安全问题，有必要对分散电流的特性进行研究。本文在COMSOL软件中建立了塔式接地装置的分散电流模型。讨论了塔周围分散电流的分布情况，并根据模拟结果确定了测试点的位置。然后建立了基于雷电电流发生器和分散电流测量系统的现场实验平台，对分散电流进行测量。结合实验数据和仿真分析，探讨了接地装置结构对分散电流特性的影响。结果表明，现场实验平台能准确测量地面电流密度，模拟结果与实测数据吻合较好。因此，该仿真模型可用于进一步研究接地装置周围的分散电流情况。距离接地电极4 ~ 5m处电流密度下降约50%，7 ~ 8m处电流密度下降约75%。接地装置附近的电流密度随着水平接地电极的延伸而减小，且距离接地装置越近，这种趋势越明显。

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2017 2nd IEEE International Conference on Integrated Circuits and Microsystems (ICICM)

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