{"title":"Proton and heavy ion testing of the Microsemi Igloo2 FPGA","authors":"S. Davis, R. Koga, J. George","doi":"10.1109/NSREC.2017.8115454","DOIUrl":null,"url":null,"abstract":"We performed proton and heavy-ion testing of the Microsemi Igloo2 FPGA using several basic designs looking at the logic, embedded SRAM, and mathblocks as well as any SEFI or high current states.","PeriodicalId":284506,"journal":{"name":"2017 IEEE Radiation Effects Data Workshop (REDW)","volume":"12 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2017-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2017 IEEE Radiation Effects Data Workshop (REDW)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/NSREC.2017.8115454","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 4
Abstract
We performed proton and heavy-ion testing of the Microsemi Igloo2 FPGA using several basic designs looking at the logic, embedded SRAM, and mathblocks as well as any SEFI or high current states.
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