{"title":"Towards smaller single-point failure-resilient analog circuits by use of a genetic algorithm","authors":"","doi":"10.33180/infmidem2023.205","DOIUrl":null,"url":null,"abstract":"Failure-resilient analog circuits are difficult to design, but artificial intelligence can help crawl the topology solution space. Us-ing evolutionary computation-based topology synthesis we evolve analog arcus tangent computational circuits, resilient to any rectifying diode or resistor high-impedance single failure or removal. We encode analog circuit topologies as individuals with an upper-triangular incident matrix. Circuits are evolved using a combined technique utilizing parts of NSGA-II and PSADE, based on a special three-dimensional robustness function. We show that topology size for a failure-resilient circuit can be classes smaller than hand-made component-redundancy-based solutions. Our best failure-resilient topology comprises six diodes, three resistors, and a voltage offset source.","PeriodicalId":56293,"journal":{"name":"Informacije Midem-Journal of Microelectronics Electronic Components and Materials","volume":"8 1","pages":"0"},"PeriodicalIF":0.6000,"publicationDate":"2023-10-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Informacije Midem-Journal of Microelectronics Electronic Components and Materials","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.33180/infmidem2023.205","RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q4","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0
Abstract
Failure-resilient analog circuits are difficult to design, but artificial intelligence can help crawl the topology solution space. Us-ing evolutionary computation-based topology synthesis we evolve analog arcus tangent computational circuits, resilient to any rectifying diode or resistor high-impedance single failure or removal. We encode analog circuit topologies as individuals with an upper-triangular incident matrix. Circuits are evolved using a combined technique utilizing parts of NSGA-II and PSADE, based on a special three-dimensional robustness function. We show that topology size for a failure-resilient circuit can be classes smaller than hand-made component-redundancy-based solutions. Our best failure-resilient topology comprises six diodes, three resistors, and a voltage offset source.
期刊介绍:
Informacije MIDEM publishes original research papers in the fields of microelectronics, electronic components and materials. Review papers are published upon invitation only. Scientific novelty and potential interest for a wider spectrum of readers is desired. Authors are encouraged to provide as much detail as possible for others to be able to replicate their results. Therefore, there is no page limit, provided that the text is concise and comprehensive, and any data that does not fit within a classical manuscript can be added as supplementary material.
Topics of interest include:
Microelectronics,
Semiconductor devices,
Nanotechnology,
Electronic circuits and devices,
Electronic sensors and actuators,
Microelectromechanical systems (MEMS),
Medical electronics,
Bioelectronics,
Power electronics,
Embedded system electronics,
System control electronics,
Signal processing,
Microwave and millimetre-wave techniques,
Wireless and optical communications,
Antenna technology,
Optoelectronics,
Photovoltaics,
Ceramic materials for electronic devices,
Thick and thin film materials for electronic devices.