Low-dose X-ray induced long afterglow NIR luminescence from Cr3+ doped Zn1–xCdxGa2O4 spinel solid solutions

IF 5.2 1区 化学 Q1 CHEMISTRY, APPLIED Journal of Rare Earths Pub Date : 2025-02-01 DOI:10.1016/j.jre.2023.12.006
Tingting Zhao , Wenzhi Sun , Shuya Wang , Wei Meng , Chunqing Fu , Xiaoyan Fu , Hongwu Zhang
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Abstract

The low-dose X-ray induced long afterglow near infrared (NIR) luminescence from Cr3+ doped Zn1–xCdxGa2O4 spinel solid solutions was investigated. The structure analysis shows the good formation of Zn1–xCdxGa2O4 spinel solid solutions, which possesses a cubic spinel structure with Fd3m space group. The formation of Zn1–xCdxGa2O4 spinel solid solutions induces the obvious increase of long afterglow near infrared luminescence excited by low-dose X-ray. When the content of doped Cd2+ reaches 0.1, the low-dose X-ray induced long afterglow NIR luminescence is the maximum. More importantly, only 5 s X-ray irradiation can induce more than 6 h NIR afterglow emission, of which the afterglow luminescent intensity is still 5 times stronger than the background intensity after 6 h. The thermoluminescent results show that under the 5 s exposure of X-ray, the trap density of Zn0.9Cd0.1Ga2O4:Cr3+ is much higher than that of ZnGa2O4:Cr3+. The replacement of Cd2+ ions with large radius at Zn2+ sites causes the increase of defects and dislocations, which results in the obvious increase of trap concentrations. And the addition of high-z number elements Cd2+ would enhance the X-ray absorption of the solid solutions, which thus can be easily excited by low-dose X-ray. Zn0.9Cd0.1Ga2O4:1%Cr3+ solid solution is a potential candidate of low-dose X-ray induced long afterglow luminescent materials.

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掺杂 Cr3+ 的 Zn1-xCdxGa2O4 尖晶石固溶体的低剂量 X 射线诱导长余辉近红外发光
研究了掺杂 Cr3+ 的 Zn1-xCdxGa2O4 尖晶石固溶体的低剂量 X 射线诱导长余辉近红外发光现象。结构分析表明 Zn1-xCdxGa2O4 尖晶石固溶体形成良好,具有 Fd3m 空间群的立方尖晶石结构。Zn1-xCdxGa2O4 尖晶石固溶体的形成明显增加了低剂量 X 射线激发的长余辉近红外发光。当掺杂 Cd2+ 的含量达到 0.1 时,低剂量 X 射线激发的长余辉近红外发光达到最大值。更重要的是,仅 5 秒的 X 射线照射就能诱发超过 6 小时的近红外余辉发射,其中 6 小时后的余辉发光强度仍比背景强度强 5 倍。热释光结果表明,在 5 s 的 X 射线照射下,Zn0.9Cd0.1Ga2O4:Cr3+ 的阱密度远高于 ZnGa2O4:Cr3+。在 Zn2+ 位点上置换大半径的 Cd2+ 离子会导致缺陷和位错的增加,从而使陷阱浓度明显增加。而高 Z 数元素 Cd2+ 的加入会增强固溶体对 X 射线的吸收,因此很容易被低剂量 X 射线激发。Zn0.9Cd0.1Ga2O4:1%Cr3+ 固溶体是低剂量 X 射线诱导长余辉发光材料的潜在候选材料。
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来源期刊
Journal of Rare Earths
Journal of Rare Earths 化学-应用化学
CiteScore
8.70
自引率
14.30%
发文量
374
审稿时长
1.7 months
期刊介绍: The Journal of Rare Earths reports studies on the 17 rare earth elements. It is a unique English-language learned journal that publishes works on various aspects of basic theory and applied science in the field of rare earths (RE). The journal accepts original high-quality original research papers and review articles with inventive content, and complete experimental data. It represents high academic standards and new progress in the RE field. Due to the advantage of abundant RE resources of China, the research on RE develops very actively, and papers on the latest progress in this field emerge every year. It is not only an important resource in which technicians publish and obtain their latest research results on RE, but also an important way of reflecting the updated progress in RE research field. The Journal of Rare Earths covers all research and application of RE rare earths including spectroscopy, luminescence and phosphors, rare earth catalysis, magnetism and magnetic materials, advanced rare earth materials, RE chemistry & hydrometallurgy, RE metallography & pyrometallurgy, RE new materials, RE solid state physics & solid state chemistry, rare earth applications, RE analysis & test, RE geology & ore dressing, etc.
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