Energy Optimization for RC and RLC Interconnect Design in Low Power VLSI

Himani Bhardwaj, Shruti Jain, Harsh Sohal
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Abstract

The global RC interconnects have become the controlling parameter for a circuit’s performance. But with the decrease in technology, an increase in resistance has become prominent. This increase further directly affects the performance of the system by increasing the performance parameters of the circuit like delay and power consumption. To resolve this issue and to be compatible with Internet of Things (IoT) applications, the interconnect circuits are required to be high speed with less heat generation In this paper, a new RC and RLC interconnect circuit design was proposed for 45nm technology to enhance the performance parameters. Furthermore, the RC interconnect design was simulated for lumped and distributed networks. The parasitic component values (resistance, inductance, and capacitance) are evaluated using PTM technology. The proposed interconnect circuit's resistance value decreased by a factor of 4, but the capacitance remains the same. Furthermore, power consumption and delay values were attained. An overall comparison was done between RC and RLC networks. 63.3% power improvement and 24.87% delay improvement were observed in the RLC network over RC distributed network.
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低功率集成电路中 RC 和 RLC 互连设计的能量优化
全球 RC 互连已成为电路性能的控制参数。但是,随着技术的进步,电阻的增加变得十分突出。电阻的增加会增加电路的性能参数,如延迟和功耗,从而进一步直接影响系统的性能。为解决这一问题并与物联网(IoT)应用兼容,要求互连电路在高速运行的同时发热量更少。本文针对 45 纳米技术提出了一种新的 RC 和 RLC 互连电路设计,以提高性能参数。此外,还模拟了块状和分布式网络的 RC 互连设计。利用 PTM 技术对寄生元件值(电阻、电感和电容)进行了评估。拟议互连电路的电阻值降低了 4 倍,但电容保持不变。此外,还获得了功耗和延迟值。与 RC 分布式网络相比,RLC 网络的功耗降低了 63.3%,延迟降低了 24.87%。
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来源期刊
Micro and Nanosystems
Micro and Nanosystems Engineering-Building and Construction
CiteScore
1.60
自引率
0.00%
发文量
50
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