{"title":"Energy Optimization for RC and RLC Interconnect Design in Low Power\nVLSI","authors":"Himani Bhardwaj, Shruti Jain, Harsh Sohal","doi":"10.2174/0118764029277963231127105304","DOIUrl":null,"url":null,"abstract":"\n\nThe global RC interconnects have become the controlling parameter for a\ncircuit’s performance. But with the decrease in technology, an increase in resistance has become\nprominent. This increase further directly affects the performance of the system by increasing the performance parameters of the circuit like delay and power consumption. To resolve this issue and to be\ncompatible with Internet of Things (IoT) applications, the interconnect circuits are required to be\nhigh speed with less heat generation\n\n\n\nIn this paper, a new RC and RLC interconnect circuit design was proposed for 45nm technology to enhance the performance parameters. Furthermore, the RC interconnect design was simulated for lumped and distributed networks. The parasitic component values (resistance, inductance,\nand capacitance) are evaluated using PTM technology.\n\n\n\nThe proposed interconnect circuit's resistance value decreased by a factor of 4, but the capacitance remains the same. Furthermore, power consumption and delay values were attained. An\noverall comparison was done between RC and RLC networks.\n\n\n\n63.3% power improvement and 24.87% delay improvement were observed in the RLC\nnetwork over RC distributed network.\n","PeriodicalId":18543,"journal":{"name":"Micro and Nanosystems","volume":"116 21","pages":""},"PeriodicalIF":0.0000,"publicationDate":"2023-12-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Micro and Nanosystems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.2174/0118764029277963231127105304","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"Engineering","Score":null,"Total":0}
引用次数: 0
Abstract
The global RC interconnects have become the controlling parameter for a
circuit’s performance. But with the decrease in technology, an increase in resistance has become
prominent. This increase further directly affects the performance of the system by increasing the performance parameters of the circuit like delay and power consumption. To resolve this issue and to be
compatible with Internet of Things (IoT) applications, the interconnect circuits are required to be
high speed with less heat generation
In this paper, a new RC and RLC interconnect circuit design was proposed for 45nm technology to enhance the performance parameters. Furthermore, the RC interconnect design was simulated for lumped and distributed networks. The parasitic component values (resistance, inductance,
and capacitance) are evaluated using PTM technology.
The proposed interconnect circuit's resistance value decreased by a factor of 4, but the capacitance remains the same. Furthermore, power consumption and delay values were attained. An
overall comparison was done between RC and RLC networks.
63.3% power improvement and 24.87% delay improvement were observed in the RLC
network over RC distributed network.