High-Temperature Measurement Technology for Microwave Surface Resistance of Metal Materials

IF 0.9 4区 工程技术 Q4 COMPUTER SCIENCE, INTERDISCIPLINARY APPLICATIONS International Journal of RF and Microwave Computer-Aided Engineering Pub Date : 2023-11-21 DOI:10.1155/2023/9930037
C. Xie, Yunpeng Zhang, Xue Niu, Ming Huang, C. Gao, Chengyong Yu, Hu Zheng, En Li
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Abstract

The resonant cavity method is a commonly used method for high-temperature testing of the complex permittivity of dielectric materials. When a resonant cavity is used for high-temperature testing, the microwave surface resistance of the cavity metal material will deteriorate due to factors such as oxidation reaction and thermal fatigue, resulting in a decrease in testing accuracy and repeatability. Therefore, when designing a high-temperature resonant cavity, the temperature response characteristics of the microwave surface resistance of the cavity metal material should be obtained in advance. In this paper, a high-temperature measurement method of microwave surface resistance of metal materials based on a separate cylindrical resonator is proposed, a mathematical model of microwave surface resistance inversion based on the resonator quality factor is established, and a high-temperature measurement system of microwave surface resistance is integrated. The reliability of the proposed method and system is verified through simulation and experiment. The measurement frequency covers 7-18 GHz, and the maximum test temperature reaches 500°C. Systematic error of microwave surface resistance measurement at room temperature is less than 3%.
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金属材料微波表面电阻的高温测量技术
谐振腔法是一种常用的介电材料复介电常数高温测试方法。使用谐振腔进行高温测试时,由于氧化反应和热疲劳等因素,腔体金属材料的微波表面电阻会变差,导致测试精度和重复性降低。因此,在设计高温谐振腔时,应提前获得腔体金属材料微波表面电阻的温度响应特性。本文提出了一种基于独立圆柱谐振器的金属材料微波表面电阻高温测量方法,建立了基于谐振器品质因数的微波表面电阻反演数学模型,并集成了微波表面电阻高温测量系统。通过仿真和实验验证了所提方法和系统的可靠性。测量频率覆盖 7-18 GHz,最高测试温度达到 500°C。室温下微波表面电阻测量的系统误差小于 3%。
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来源期刊
CiteScore
4.00
自引率
23.50%
发文量
489
审稿时长
3 months
期刊介绍: International Journal of RF and Microwave Computer-Aided Engineering provides a common forum for the dissemination of research and development results in the areas of computer-aided design and engineering of RF, microwave, and millimeter-wave components, circuits, subsystems, and antennas. The journal is intended to be a single source of valuable information for all engineers and technicians, RF/microwave/mm-wave CAD tool vendors, researchers in industry, government and academia, professors and students, and systems engineers involved in RF/microwave/mm-wave technology. Multidisciplinary in scope, the journal publishes peer-reviewed articles and short papers on topics that include, but are not limited to. . . -Computer-Aided Modeling -Computer-Aided Analysis -Computer-Aided Optimization -Software and Manufacturing Techniques -Computer-Aided Measurements -Measurements Interfaced with CAD Systems In addition, the scope of the journal includes features such as software reviews, RF/microwave/mm-wave CAD related news, including brief reviews of CAD papers published elsewhere and a "Letters to the Editor" section.
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