A cone penetration test database for multiple thin-layer correction procedure development

Kaleigh M. Yost, A. Yerro, Eileen R Martin, Russell A Green
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Abstract

Cone penetration tests (CPTs) are a commonly used in situ method to characterize soil. The recorded data are used for various applications, including earthquake-induced liquefaction evaluation. However, data recorded at a given depth in a CPT sounding are influenced by the properties of all the soil that falls within the zone of influence around the cone tip rather than only the soil at that particular depth. This causes data to be blurred or averaged in layered zones, a phenomenon referred to as multiple thin-layer effects. Multiple thin-layer effects can result in the inaccurate characterization of the thickness and stiffness of thin, interbedded layers. Correction procedures have been proposed to adjust CPT tip resistance for multiple thin-layer effects, but many procedures become less effective as layer thickness decreases. To compare or improve these procedures and to develop new ones, it is critical to have pairs of measured tip resistance ( q m) and true tip resistance ( q t) data, where q m is the tip resistance recorded by the CPT in a layered profile, and q t represents the tip resistance that would be measured in the profile absent of multiple thin-layer effects. Unfortunately, data sets containing q m and q t pairs are extremely rare. Accordingly, this article presents a unique database containing laboratory and numerically generated CPT data from 49 highly interlayered soil profiles. Both q m and q t are provided for each profile. An accompanying Jupyter notebook is provided to facilitate the use of the data and prepare them for future statistical learning (or other) applications to support multiple thin-layer correction procedure development.
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用于开发多薄层校正程序的锥入试验数据库
锥入度试验(CPT)是一种常用的现场土壤表征方法。记录的数据可用于各种用途,包括地震诱发的液化评估。然而,CPT 在特定深度记录的数据会受到锥尖周围影响区内所有土壤特性的影响,而非仅受该特定深度土壤特性的影响。这会导致分层区域的数据模糊或平均化,这种现象被称为多重薄层效应。多重薄层效应会导致对薄层、夹层的厚度和刚度表征不准确。已经提出了一些修正程序来调整 CPT 顶端阻力,以适应多重薄层效应,但许多程序随着层厚度的减小而变得不那么有效。要比较或改进这些程序并开发新的程序,关键是要有成对的测量顶端阻力(q m)和真实顶端阻力(q t)数据,其中 q m 是 CPT 在分层剖面中记录的顶端阻力,q t 代表在没有多薄层效应的剖面中测量的顶端阻力。遗憾的是,包含 q m 和 q t 对的数据集极为罕见。因此,本文提供了一个独特的数据库,其中包含 49 个高度互层土壤剖面的实验室和数值生成的 CPT 数据。每个剖面都提供了 q m 和 q t。随附的 Jupyter 笔记本可方便使用这些数据,并为未来的统计学习(或其他)应用做好准备,以支持多薄层校正程序的开发。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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