Correction of step size dependency in local misorientation obtained by EBSD measurements: Introducing equidistant local misorientation

IF 2.1 3区 工程技术 Q2 MICROSCOPY Ultramicroscopy Pub Date : 2024-02-01 DOI:10.1016/j.ultramic.2024.113928
Masayuki Kamaya
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Abstract

The local misorientation, known as KAM, is affected by both the step size (representing the spacing of measurement points applied in orientation measurements) and the point distance (indicating the distance between the points used in the misorientation calculation). The point distance can be increased by selecting surrounding points that are far from the target point. This study proposed the concept of an equidistant local misorientation, for which surrounding points at the same point distance from the target point were selected to calculate misorientation. An arbitrary point distance can be set for the equidistant local misorientation regardless of the step size. The changes in equidistant local misorientation for various point distances were calculated for the crystal orientation datasets obtained with different step sizes and measurement grids (square or hexagonal) using Type 316 stainless steel specimens, in which plastic strain of about 5 % was induced. It was shown that the equidistant local misorientation was identical regardless of the step size and measurement grid when the same point distance was used. Then, it was concluded that the difference in the local misorientation which emanated from the difference in step size could be corrected by employing the equidistant local misorientation. Increasing the point distance improved the signal-to-noise (S/N) ratio in the mapping data of the equidistant local misorientation. However, the results suggested that the maximum point distance for enhancing the S/N ratio should be within 30 % of the average grain size. On the other hand, decreasing the step size by keeping the point distance constant was found not to improve the S/N ratio, while it enhanced the spatial resolution of the mapping data.

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校正 EBSD 测量获得的局部错向的步长依赖性:引入等距局部错向
被称为 KAM 的局部方向偏差受步长(表示方向测量中测量点的间距)和点距(表示方向偏差计算中使用的点之间的距离)的影响。可以通过选择远离目标点的周围点来增加点距。本研究提出了等距局部迷失方向的概念,即选择与目标点点距相同的周围点来计算迷失方向。无论步长大小如何,都可以为等距局部迷失方向设置任意点距。使用 316 型不锈钢试样计算了不同步长和测量网格(正方形或六角形)下获得的晶体取向数据集在不同点距下的等距局部定向错误的变化,在试样中诱导了约 5% 的塑性应变。结果表明,在使用相同点距的情况下,无论步长大小和测量网格如何,等距局部错向都是相同的。因此可以得出结论,步长不同造成的局部迷失方向差异可以通过采用等距局部迷失方向来纠正。增加点距可以改善等距局部测偏法测绘数据的信噪比(S/N)。但结果表明,提高信噪比的最大点距应在平均晶粒尺寸的 30% 以内。另一方面,在保持点距不变的情况下减小步长并不能提高信噪比,但却提高了测绘数据的空间分辨率。
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来源期刊
Ultramicroscopy
Ultramicroscopy 工程技术-显微镜技术
CiteScore
4.60
自引率
13.60%
发文量
117
审稿时长
5.3 months
期刊介绍: Ultramicroscopy is an established journal that provides a forum for the publication of original research papers, invited reviews and rapid communications. The scope of Ultramicroscopy is to describe advances in instrumentation, methods and theory related to all modes of microscopical imaging, diffraction and spectroscopy in the life and physical sciences.
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