Fast-neutron soft-error tolerance experimentation with a radiation-hardened optically reconfigurable gate array

Abstract

Nuclear power plants and their decommissioning operations require radiation-hardened devices that are robust against neutron because recriticality might happen while doing decommissioning tasks. To realize devices able to withstand such environments, optically reconfigurable gate arrays have been developed. This paper presents radiation tolerance experiment results obtained for a radiation-hardened optically reconfigurable gate array using a fast-neutron beam.