A study on the effect of the geometric properties and surface defects on silicon chip flexibility for wearable electronics

IF 1.7 4区 材料科学 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC Soldering & Surface Mount Technology Pub Date : 2024-05-02 DOI:10.1108/ssmt-11-2023-0066
Yan Pan, Taiyu Jin, Xiaohui Peng, Pengli Zhu, Kyung W. Paik
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Abstract

Purpose

The purpose of this paper was to investigate how variations in the geometry of silicon chips and the presence of surface defects affect their static bending properties. By comparing the bending radius and strength across differently sized and treated chips, the study sought to understand the underlying mechanics that contribute to the flexibility of silicon-based electronic devices. This understanding is crucial for the development of advanced, robust and adaptable electronic systems that can withstand the rigors of manufacturing and everyday use.

Design/methodology/approach

This study explores the impact of silicon chip geometry and surface defects on flexibility through a multifaceted experimental approach. The methodology included preparing silicon chips of three distinct dimensions and subjecting them to thinning processes to achieve a uniform thickness verified via scanning electron microscopy (SEM). Finite element method (FEM) simulations and a series of four-point bending tests were used to analyze the bending flexibility theoretically and experimentally. The approach was comprehensive, examining both the intrinsic geometric factors and the extrinsic influence of surface defects induced by manufacturing processes.

Findings

The findings revealed a significant deviation between the theoretical predictions from FEM simulations and the experimental outcomes from the four-point bending tests. Rectangular-shaped chips demonstrated superior flexibility, with smaller dimensions leading to an increased bending strength. Surface defects, identified as critical factors affecting flexibility, were analyzed through SEM and atomic force microscopy, showing that etching processes could reduce defect density and enhance flexibility. Notably, the study concluded that surface defects have a more pronounced impact on silicon chip flexibility than geometric factors, challenging initial assumptions and highlighting the need for defect minimization in chip manufacturing.

Originality/value

This research contributes valuable insights into the design and fabrication of flexible electronic devices, emphasizing the significant role of surface defects over geometric considerations in determining silicon chip flexibility. The originality of the work lies in its holistic approach to dissecting the factors influencing silicon chip flexibility, combining theoretical simulations with practical bending tests and surface defect analysis. The findings underscore the importance of optimizing manufacturing processes to reduce surface defects, thereby paving the way for the creation of more durable and flexible electronic devices for future technologies.

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几何特性和表面缺陷对可穿戴电子设备硅芯片柔韧性的影响研究
本文旨在研究硅芯片几何形状的变化和表面缺陷的存在如何影响其静态弯曲特性。通过比较不同尺寸和处理的芯片的弯曲半径和强度,该研究试图了解导致硅基电子设备灵活性的基本力学原理。这种理解对于开发先进、坚固和适应性强的电子系统至关重要,因为这些系统能够经受住生产和日常使用中的严酷考验。实验方法包括制备三种不同尺寸的硅芯片,并对其进行减薄处理,以达到通过扫描电子显微镜(SEM)验证的均匀厚度。使用有限元法(FEM)模拟和一系列四点弯曲测试对弯曲柔性进行理论和实验分析。研究结果表明,有限元模拟的理论预测与四点弯曲测试的实验结果之间存在显著偏差。矩形芯片表现出更优越的柔韧性,尺寸更小,弯曲强度更高。表面缺陷是影响柔韧性的关键因素,通过扫描电子显微镜和原子力显微镜分析表明,蚀刻工艺可以降低缺陷密度,提高柔韧性。值得注意的是,研究得出的结论是,表面缺陷对硅芯片柔性的影响比几何因素更明显,这对最初的假设提出了挑战,并强调了在芯片制造中尽量减少缺陷的必要性。 原创性/价值这项研究为柔性电子设备的设计和制造提供了宝贵的见解,强调了表面缺陷比几何因素在决定硅芯片柔性方面的重要作用。这项工作的独创性在于它采用了整体方法,将理论模拟与实际弯曲测试和表面缺陷分析相结合,剖析了影响硅芯片柔性的各种因素。研究结果强调了优化制造工艺以减少表面缺陷的重要性,从而为未来技术创造更耐用、更灵活的电子设备铺平了道路。
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来源期刊
Soldering & Surface Mount Technology
Soldering & Surface Mount Technology 工程技术-材料科学:综合
CiteScore
4.10
自引率
15.00%
发文量
30
审稿时长
>12 weeks
期刊介绍: Soldering & Surface Mount Technology seeks to make an important contribution to the advancement of research and application within the technical body of knowledge and expertise in this vital area. Soldering & Surface Mount Technology compliments its sister publications; Circuit World and Microelectronics International. The journal covers all aspects of SMT from alloys, pastes and fluxes, to reliability and environmental effects, and is currently providing an important dissemination route for new knowledge on lead-free solders and processes. The journal comprises a multidisciplinary study of the key materials and technologies used to assemble state of the art functional electronic devices. The key focus is on assembling devices and interconnecting components via soldering, whilst also embracing a broad range of related approaches.
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