Yingjie Jiang, Anqi Tian, Li Yan, Xueqi Du, Lanmei Yang, Li Li, Jie Zhou, Qi Wang, Shuai Ruan, Xinping He, Yongqi Zhang, Xiaoping Yu, Yuanyuan Jiang, Fangfang Tu, Jiayuan Xiang, Wangjun Wan, Chen Wang, Yang Xia, Xinhui Xia, Wenkui Zhang
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引用次数: 0
Abstract
As the global lithium-ion batteries (LIBs) market continues to expand, the necessity for dependable and secure LIBs has reached an all-time high. However, the use of batteries is associated with a number of significant risks, including the potential for thermal runaway and explosions. The meticulous inspection of LIBs is not only essential for guaranteeing their quality and functionality, but also for ensuring their safety. This underscores the criticality of advanced inspection technologies. In contrast to traditional inspection technologies, industrial x-ray computed tomography (CT) scanning technology affords a non-destructive comprehensive, three-dimensional insight into the interior structure of a battery without the need for disassembly. It can make the inner LIBs structures visible through the housing and even batteries already installed in devices can be examined safely and accurately without being removed or opened. This capability is of critical importance for the identification of defects that could lead to battery failure or safety issues, and guide the optimization of LIBs with better safety and performance. This perspective review briefly summarize the comprehensive application of industrial CT in LIBs including battery materials, cells and modules. Finally, we further discuss the challenges and prospects of industrial CT for energy storage.
期刊介绍:
The Journal of Electronic Materials (JEM) reports monthly on the science and technology of electronic materials, while examining new applications for semiconductors, magnetic alloys, dielectrics, nanoscale materials, and photonic materials. The journal welcomes articles on methods for preparing and evaluating the chemical, physical, electronic, and optical properties of these materials. Specific areas of interest are materials for state-of-the-art transistors, nanotechnology, electronic packaging, detectors, emitters, metallization, superconductivity, and energy applications.
Review papers on current topics enable individuals in the field of electronics to keep abreast of activities in areas peripheral to their own. JEM also selects papers from conferences such as the Electronic Materials Conference, the U.S. Workshop on the Physics and Chemistry of II-VI Materials, and the International Conference on Thermoelectrics. It benefits both specialists and non-specialists in the electronic materials field.
A journal of The Minerals, Metals & Materials Society.