Firefly Algorithm-Driven Development of Resistive Ink-Coated Glass and Mesh Fibers for Advanced Microwave Stealth and EMI Shielding Applications

IF 2.2 4区 工程技术 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC Journal of Electronic Materials Pub Date : 2024-09-11 DOI:10.1007/s11664-024-11405-1
Deepanshu Sahu, Ravi Panwar
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Abstract

The design and development of efficient microwave-absorbing and electromagnetic interference (EMI) shielding materials and structures to conceal electromagnetic (EM) waves remains a consistent and challenging task. Despite advancements in materials science and microwave engineering, there is a need for optimized materials that offer both effective microwave absorption and EMI shielding while minimizing material layer thickness. This research aims to address this gap by utilizing the firefly algorithm (FFA) to predict the optimal medium properties and thickness of microwave-absorbing and EMI shielding materials under specific constraints. In this context, a comprehensive investigation was carried out at the X-band involving numerical and experimental EM characterization of novel lightweight fiber-based samples. Additionally, the FFA has been applied to optimize these fiber-based microwave structures within the given constraints. Two separate objective functions (OBF) targeting minimum sample thickness, maximum microwave absorption, and shielding effectiveness (SE) bandwidth have been integrated into the FFA to address the thickness–bandwidth trade-off issue. Subsequently, resistive ink-coated glass fiber (IGF) and ink-coated mesh fiber (IMF) were developed and characterized based on the optimal solutions provided by the FFA. Consequently, an optimized IMF sample provides a minimum reflection coefficient (RC) of −19.0 dB at 10.7 GHz with a bandwidth of 2.8 GHz (9.6 to 12.4 GHz) below the −10 dB threshold. Besides, the optimal IGF sample achieves maximum SE of 11 dB at thickness of only 0.8 mm and covers the entire operating band. Furthermore, the response of the proposed structure was assessed for various oblique angles of incidence, revealing significant potential for various practical applications. A strong correlation between measured and theoretical findings underscores the potential of the proposed approach in realizing efficient microwave stealth and EMI shielding materials.

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萤火虫算法驱动的用于先进微波隐形和 EMI 屏蔽应用的电阻油墨涂层玻璃和网状光纤的开发
设计和开发高效的微波吸收和电磁干扰(EMI)屏蔽材料和结构以掩盖电磁波,始终是一项具有挑战性的任务。尽管材料科学和微波工程取得了进步,但仍需要既能提供有效微波吸收和电磁干扰屏蔽,又能最大限度减少材料层厚度的优化材料。本研究旨在利用萤火虫算法(FFA)来预测特定约束条件下微波吸收和 EMI 屏蔽材料的最佳介质特性和厚度,从而弥补这一不足。在此背景下,对新型轻质纤维样品的 X 波段电磁特性进行了数值和实验方面的综合研究。此外,在给定的约束条件下,应用 FFA 对这些纤维微波结构进行了优化。两个独立的目标函数(OBF)分别针对最小样品厚度、最大微波吸收和屏蔽效能(SE)带宽,已被集成到 FFA 中,以解决厚度-带宽权衡问题。随后,根据 FFA 提供的最佳解决方案,开发了电阻油墨涂层玻璃纤维 (IGF) 和油墨涂层网状纤维 (IMF),并对其进行了表征。因此,经过优化的 IMF 样品在 10.7 GHz 时的最小反射系数 (RC) 为 -19.0 dB,带宽为 2.8 GHz(9.6 至 12.4 GHz),低于 -10 dB 门限。此外,最佳 IGF 样品在厚度仅为 0.8 毫米的情况下实现了 11 dB 的最大 SE,并覆盖了整个工作频带。此外,还评估了拟议结构在各种斜入射角度下的响应,揭示了其在各种实际应用中的巨大潜力。测量结果与理论结果之间的紧密相关性凸显了所提方法在实现高效微波隐身和电磁干扰屏蔽材料方面的潜力。
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来源期刊
Journal of Electronic Materials
Journal of Electronic Materials 工程技术-材料科学:综合
CiteScore
4.10
自引率
4.80%
发文量
693
审稿时长
3.8 months
期刊介绍: The Journal of Electronic Materials (JEM) reports monthly on the science and technology of electronic materials, while examining new applications for semiconductors, magnetic alloys, dielectrics, nanoscale materials, and photonic materials. The journal welcomes articles on methods for preparing and evaluating the chemical, physical, electronic, and optical properties of these materials. Specific areas of interest are materials for state-of-the-art transistors, nanotechnology, electronic packaging, detectors, emitters, metallization, superconductivity, and energy applications. Review papers on current topics enable individuals in the field of electronics to keep abreast of activities in areas peripheral to their own. JEM also selects papers from conferences such as the Electronic Materials Conference, the U.S. Workshop on the Physics and Chemistry of II-VI Materials, and the International Conference on Thermoelectrics. It benefits both specialists and non-specialists in the electronic materials field. A journal of The Minerals, Metals & Materials Society.
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