{"title":"Concurrent control chart pattern recognition in manufacturing processes based on zero-shot learning","authors":"Yazhou Li , Wei Dai , Shuang Yu , Yihai He","doi":"10.1016/j.isatra.2024.09.001","DOIUrl":null,"url":null,"abstract":"<div><div>In real industrial settings, collecting and labeling concurrent abnormal control chart pattern (CCP) samples are challenging, thereby hindering the effectiveness of current CCP recognition (CCPR) methods. This paper introduces zero-shot learning into quality control, proposing an intelligent model for recognizing zero-shot concurrent CCPs (C-CCPs). A multiscale ordinal pattern (OP) feature considering data sequential relationship is proposed. Drawing from expert knowledge, an attribute description space (ADS) is established to infer from single CCPs to C-CCPs. An ADS is embedded between features and labels, and the attribute classifier associates the features and attributes of CCPs. Experimental results demonstrate an accuracy of 98.73 % for 11 unseen C-CCPs and an overall accuracy of 98.89 % for all 19 CCPs, without C-CCP samples in training. Compared with other features, the multiscale OP feature has the best recognition effect on unseen C-CCPs.</div></div>","PeriodicalId":14660,"journal":{"name":"ISA transactions","volume":"154 ","pages":"Pages 228-241"},"PeriodicalIF":6.3000,"publicationDate":"2024-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"ISA transactions","FirstCategoryId":"94","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S0019057824004221","RegionNum":2,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"AUTOMATION & CONTROL SYSTEMS","Score":null,"Total":0}
引用次数: 0
Abstract
In real industrial settings, collecting and labeling concurrent abnormal control chart pattern (CCP) samples are challenging, thereby hindering the effectiveness of current CCP recognition (CCPR) methods. This paper introduces zero-shot learning into quality control, proposing an intelligent model for recognizing zero-shot concurrent CCPs (C-CCPs). A multiscale ordinal pattern (OP) feature considering data sequential relationship is proposed. Drawing from expert knowledge, an attribute description space (ADS) is established to infer from single CCPs to C-CCPs. An ADS is embedded between features and labels, and the attribute classifier associates the features and attributes of CCPs. Experimental results demonstrate an accuracy of 98.73 % for 11 unseen C-CCPs and an overall accuracy of 98.89 % for all 19 CCPs, without C-CCP samples in training. Compared with other features, the multiscale OP feature has the best recognition effect on unseen C-CCPs.
期刊介绍:
ISA Transactions serves as a platform for showcasing advancements in measurement and automation, catering to both industrial practitioners and applied researchers. It covers a wide array of topics within measurement, including sensors, signal processing, data analysis, and fault detection, supported by techniques such as artificial intelligence and communication systems. Automation topics encompass control strategies, modelling, system reliability, and maintenance, alongside optimization and human-machine interaction. The journal targets research and development professionals in control systems, process instrumentation, and automation from academia and industry.