Investigation of Dielectric and Piezoelectric Properties of Polyvinylidene Fluoride Films Reinforced with Anatase Phase Titanium Dioxide for Pressure Sensing

IF 2.2 4区工程技术 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC Journal of Electronic Materials Pub Date : 2024-10-07 DOI:10.1007/s11664-024-11499-7

Krishna Tewatia, Anuradha Sharma, Sohan Lal, Sridharbabu Yarramaneni, Tanuj Kumar, Arun Kumar

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Abstract

In the present study, anatase phase titanium dioxide (A-TiO₂)-reinforced polyvinylidene fluoride (PVDF) nanocomposite films are synthesized by the solvent casting method. The electroactive phase, dielectric, and piezoelectric properties are studied for A-TiO₂ nanoparticles at 0.8 wt.%, 1.6 wt.%, 2.4 wt.%, 3.2 wt.%, and 4.0 wt.% content in the PVDF matrix. X-ray diffraction (XRD) and Fourier transform infrared (FTIR) spectroscopy are used to assess the structural properties and the enhancement in the electroactive β phase, respectively. The β phase is found to improve up to 77%. Atomic force microscopy (AFM) shows that the roughness of the films increases with an increase in the amount of reinforcement. The dielectric constant (ε′) and dissipation factor are found to vary with filler weight percentage and frequency. The dielectric constant increases to 24.45 for 2.4 wt.% of A-TiO₂ nanoparticles. The piezo-response increases significantly from 0.6 V to 1.3 V for the nanocomposite in comparison to pure PVDF films. The results of the current study show numerous potential applications in energy-harvesting pressure sensors.

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锐钛矿相二氧化钛增强聚偏氟乙烯薄膜的介电和压电性能研究

本研究采用溶剂铸造法制备了锐钛矿相二氧化钛（A-TiO2）增强聚偏氟乙烯（PVDF）纳米复合薄膜。研究了A-TiO2纳米粒子在PVDF基体中含量为0.8 wt.%、1.6 wt.%、2.4 wt.%、3.2 wt.%和4.0 wt.%时的电活性相、介电和压电性能。利用x射线衍射（XRD）和傅里叶变换红外光谱（FTIR）分别评价了结构性能和电活性β相的增强。β相提高了77%。原子力显微镜（AFM）结果表明，膜的粗糙度随增强量的增加而增加。发现介电常数ε′和耗散系数随填料的重量百分比和频率而变化。当A-TiO2纳米粒子质量分数为2.4 wt.%时，介电常数增加到24.45。与纯PVDF膜相比，纳米复合材料的压电响应从0.6 V显著增加到1.3 V。目前的研究结果显示了能量收集压力传感器的许多潜在应用。

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来源期刊

Journal of Electronic Materials 工程技术-材料科学：综合

CiteScore

4.10

自引率

4.80%

发文量

693

审稿时长

3.8 months

期刊介绍： The Journal of Electronic Materials (JEM) reports monthly on the science and technology of electronic materials, while examining new applications for semiconductors, magnetic alloys, dielectrics, nanoscale materials, and photonic materials. The journal welcomes articles on methods for preparing and evaluating the chemical, physical, electronic, and optical properties of these materials. Specific areas of interest are materials for state-of-the-art transistors, nanotechnology, electronic packaging, detectors, emitters, metallization, superconductivity, and energy applications. Review papers on current topics enable individuals in the field of electronics to keep abreast of activities in areas peripheral to their own. JEM also selects papers from conferences such as the Electronic Materials Conference, the U.S. Workshop on the Physics and Chemistry of II-VI Materials, and the International Conference on Thermoelectrics. It benefits both specialists and non-specialists in the electronic materials field. A journal of The Minerals, Metals & Materials Society.