Relaxation processes in swift heavy ion irradiated poly(vinylidene fluoride) films

Abstract

The article reports on the investigation of relaxation processes occurring in poly(vinylidene fluoride) (PVDF) films irradiated with swift heavy ions (SHI) of Ne, Xe, and Bi by thermally stimulated depolarization current (TSDC) methods. Two relaxation processes observed in the pristine PVDF films in the temperature range from −10 to 40 °C were associated with ${\alpha }_{с}$-relaxation. It has been shown that SHI irradiation shifts the maxima of the relaxation processes to a higher temperature region following a decrease in the current as compared to the non-irradiated polymer. An effect of electronic energy loss is emphasized. An increase in the Xe ion beam fluence caused a decrease in the frequency factor, suggesting a change in the size and hence the mass of the relaxor units. Chemical etching of the created Xe ion tracks resulted in the appearance of a new relaxation process associated with the activation of defects at the boundary between the track walls and the undamaged polymer.