JoBiS: Joint capacitance and inductance bit stuffing CAC for interposer based multi-chip Deep Learning Accelerator

IF 2.2 3区 工程技术 Q3 COMPUTER SCIENCE, HARDWARE & ARCHITECTURE Integration-The Vlsi Journal Pub Date : 2025-02-12 DOI:10.1016/j.vlsi.2025.102347
Zahra Shirmohammadi, Masoumeh Taali
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引用次数: 0

Abstract

Interposer-based multi-chip Deep Learning Accelerator (DLA) profoundly influences the design of artificial intelligence (AI) hardware. However, data transmission over wires in Network-on-Chip (NoC)-based Deep Learning Accelerators (DLAs) encounters crosstalk faults as a major challenge. These faults arise due to mutual capacitance and inductance influences between adjacent wires of the NoCs. To address this issue, this paper introduces JoBiS, a bit-stuffing algorithm that takes into account both capacitance and inductance coupling effects. JoBiS aims to prevent the occurrence of the worst delay transitions in inductance coupling, such as 0000011111,1111100000, and 00-0011-11, as well as in capacitive coupling, including 11-1100-00, 0101010101, and 1010101010, in a 5-bit wire model. This is achieved through a simple and low-power algorithm. To reduce delay and area overhead in large buses, a bus partitioning-based CAC called JoBiS is proposed. The simulation results indicate that the power consumption and delay are significantly improved compared to other methods. On average, JoBiS reduces power consumption and critical path delay by 83% and 70%, respectively, across various bus widths.
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来源期刊
Integration-The Vlsi Journal
Integration-The Vlsi Journal 工程技术-工程:电子与电气
CiteScore
3.80
自引率
5.30%
发文量
107
审稿时长
6 months
期刊介绍: Integration''s aim is to cover every aspect of the VLSI area, with an emphasis on cross-fertilization between various fields of science, and the design, verification, test and applications of integrated circuits and systems, as well as closely related topics in process and device technologies. Individual issues will feature peer-reviewed tutorials and articles as well as reviews of recent publications. The intended coverage of the journal can be assessed by examining the following (non-exclusive) list of topics: Specification methods and languages; Analog/Digital Integrated Circuits and Systems; VLSI architectures; Algorithms, methods and tools for modeling, simulation, synthesis and verification of integrated circuits and systems of any complexity; Embedded systems; High-level synthesis for VLSI systems; Logic synthesis and finite automata; Testing, design-for-test and test generation algorithms; Physical design; Formal verification; Algorithms implemented in VLSI systems; Systems engineering; Heterogeneous systems.
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