Improved Conductivity of Low-Temperature-Synthesized Graphene/Cu for CMOS Backend-of-Line Interconnect Applications

IF 4.4 3区 材料科学 Q2 CHEMISTRY, MULTIDISCIPLINARY Advanced Materials Interfaces Pub Date : 2024-10-22 DOI:10.1002/admi.202400622
Peng-Chi Wang, Yi-Hsiang Shih, Chih-Yuan Tseng, Yu-Jin Liu, Yao-Hung Huang, Chrong-Jung Lin, Ya-Chin King, Wei-Chen Tu
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Abstract

This study proposes a synthesis strategy of high-quality graphene films on the copper foil at a temperature of 400 °C throughout the graphene growth process without employing high-temperature annealing. Through continuous CO2 laser pretreatment of the copper foil, the surface smoothness improves, and the removal of copper particles and copper oxide results in fewer defects on the foil. Therefore, the nucleation density of graphene is reduced, leading to a more uniform and continuous graphene film and showing an outstanding quality of graphene with low defects and low resistivity compared with other groups. After laser treatment, the copper foil's resistivity decreases from 1.71 ×10−8 to 1.51 ×10−8 Ω·m. The graphene-coated on laser-treated foil experiences an even more substantial decrease in resistivity, from 1.34 ×10−8 to 1.18 ×10−8 Ω·m, marking a significant 11.94% reduction. Excitingly, the groundbreaking technique is taken to the next level by applying it to fine copper interconnects as narrow as 0.4 µm. The experiments confirm the successful cultivation of graphene on these miniature scales, showing the immense potential of the approach. The proposed approach aligns with the demands of contemporary CMOS backend-of-line processes, facilitating the seamless incorporation of graphene in advanced chip technologies.

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用于CMOS后端线互连应用的低温合成石墨烯/Cu的电导率提高
本研究提出了一种在整个石墨烯生长过程中,在400°C的温度下在铜箔上合成高质量石墨烯薄膜的策略,而无需采用高温退火。通过对铜箔进行连续CO2激光预处理,提高了铜箔的表面光洁度,去除了铜颗粒和氧化铜,减少了铜箔上的缺陷。因此,石墨烯的成核密度降低,导致石墨烯薄膜更加均匀和连续,与其他基团相比,石墨烯具有低缺陷和低电阻率的优异品质。激光处理后,铜箔的电阻率由1.71 ×10−8降低到1.51 ×10−8 Ω·m。涂覆石墨烯的激光处理箔的电阻率下降幅度更大,从1.34 ×10−8降至1.18 ×10−8 Ω·m,显著降低11.94%。令人兴奋的是,这项突破性的技术被应用到窄至0.4微米的细铜互连中,达到了一个新的水平。实验证实了石墨烯在这些微型尺度上的成功培养,显示了该方法的巨大潜力。所提出的方法符合当代CMOS后端工艺的要求,促进了石墨烯在先进芯片技术中的无缝结合。
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来源期刊
Advanced Materials Interfaces
Advanced Materials Interfaces CHEMISTRY, MULTIDISCIPLINARY-MATERIALS SCIENCE, MULTIDISCIPLINARY
CiteScore
8.40
自引率
5.60%
发文量
1174
审稿时长
1.3 months
期刊介绍: Advanced Materials Interfaces publishes top-level research on interface technologies and effects. Considering any interface formed between solids, liquids, and gases, the journal ensures an interdisciplinary blend of physics, chemistry, materials science, and life sciences. Advanced Materials Interfaces was launched in 2014 and received an Impact Factor of 4.834 in 2018. The scope of Advanced Materials Interfaces is dedicated to interfaces and surfaces that play an essential role in virtually all materials and devices. Physics, chemistry, materials science and life sciences blend to encourage new, cross-pollinating ideas, which will drive forward our understanding of the processes at the interface. Advanced Materials Interfaces covers all topics in interface-related research: Oil / water separation, Applications of nanostructured materials, 2D materials and heterostructures, Surfaces and interfaces in organic electronic devices, Catalysis and membranes, Self-assembly and nanopatterned surfaces, Composite and coating materials, Biointerfaces for technical and medical applications. Advanced Materials Interfaces provides a forum for topics on surface and interface science with a wide choice of formats: Reviews, Full Papers, and Communications, as well as Progress Reports and Research News.
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