Influence of moisture concentration and hydrophobic material on induced stress in FCBGA package under reflow

IF 1.7 4区 材料科学 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC Soldering & Surface Mount Technology Pub Date : 2021-08-26 DOI:10.1108/ssmt-04-2021-0015
Elwin Heng, M. Z. Abdullah
{"title":"Influence of moisture concentration and hydrophobic material on induced stress in FCBGA package under reflow","authors":"Elwin Heng, M. Z. Abdullah","doi":"10.1108/ssmt-04-2021-0015","DOIUrl":null,"url":null,"abstract":"\nPurpose\nThis paper focuses on the fluid-structure interaction (FSI) analysis of moisture induced stress for the flip chip ball grid array (FCBGA) package with hydrophobic and hydrophilic materials during the reflow soldering process. The purpose of this paper is to analyze the influence of moisture concentration and FCBGA with hydrophobic material on induced pressure and stress in the package at varies times.\n\n\nDesign/methodology/approach\nThe present study analyzed the warpage deformation during the reflow process via visual inspection machine (complied to Joint Electron Device Engineering Council standard) and FSI simulation by using ANSYS/FLUENT package. The direct concentration approach is used to model moisture diffusion and ANSYS is used to predict the Von-Misses stress. Models of Test Vehicle 1 (similar to Xie et al., 2009b) and Test Vehicle 2 (FCBGA package) with the combination of hydrophobic and hydrophilic materials are performed. The simulation for different moisture concentrations with reflows process time has been conducted.\n\n\nFindings\nThe results from the mechanical reliability study indicate that the FSI analysis is found to be in good agreement with the published study and acceptable agreement with the experimental result. The maximum Von-Misses stress induced by the moisture significantly increased on FCBGA with hydrophobic material compared to FCBGA with a hydrophilic material. The presence of hydrophobic material that hinders the moisture desorption process. The analysis also illustrated the moisture could very possibly reside in electronic packaging and developed beyond saturated vapor into superheated vapor or compressed liquid, which exposed electronic packaging to higher stresses.\n\n\nPractical implications\nThe findings provide valuable guidelines and references to engineers and packaging designers during the reflow soldering process in the microelectronics industry.\n\n\nOriginality/value\nStudies on the influence of moisture concentration and hydrophobic material are still limited and studies on FCBGA package warpage under reflow process involving the effect of hydrophobic and hydrophilic materials are rarely reported. Thus, this study is important to effectively bridge the research gap and yield appropriate guidelines in the microelectronics industry.\n","PeriodicalId":49499,"journal":{"name":"Soldering & Surface Mount Technology","volume":" ","pages":""},"PeriodicalIF":1.7000,"publicationDate":"2021-08-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Soldering & Surface Mount Technology","FirstCategoryId":"88","ListUrlMain":"https://doi.org/10.1108/ssmt-04-2021-0015","RegionNum":4,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 1

Abstract

Purpose This paper focuses on the fluid-structure interaction (FSI) analysis of moisture induced stress for the flip chip ball grid array (FCBGA) package with hydrophobic and hydrophilic materials during the reflow soldering process. The purpose of this paper is to analyze the influence of moisture concentration and FCBGA with hydrophobic material on induced pressure and stress in the package at varies times. Design/methodology/approach The present study analyzed the warpage deformation during the reflow process via visual inspection machine (complied to Joint Electron Device Engineering Council standard) and FSI simulation by using ANSYS/FLUENT package. The direct concentration approach is used to model moisture diffusion and ANSYS is used to predict the Von-Misses stress. Models of Test Vehicle 1 (similar to Xie et al., 2009b) and Test Vehicle 2 (FCBGA package) with the combination of hydrophobic and hydrophilic materials are performed. The simulation for different moisture concentrations with reflows process time has been conducted. Findings The results from the mechanical reliability study indicate that the FSI analysis is found to be in good agreement with the published study and acceptable agreement with the experimental result. The maximum Von-Misses stress induced by the moisture significantly increased on FCBGA with hydrophobic material compared to FCBGA with a hydrophilic material. The presence of hydrophobic material that hinders the moisture desorption process. The analysis also illustrated the moisture could very possibly reside in electronic packaging and developed beyond saturated vapor into superheated vapor or compressed liquid, which exposed electronic packaging to higher stresses. Practical implications The findings provide valuable guidelines and references to engineers and packaging designers during the reflow soldering process in the microelectronics industry. Originality/value Studies on the influence of moisture concentration and hydrophobic material are still limited and studies on FCBGA package warpage under reflow process involving the effect of hydrophobic and hydrophilic materials are rarely reported. Thus, this study is important to effectively bridge the research gap and yield appropriate guidelines in the microelectronics industry.
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
水分浓度和疏水材料对FCBGA封装回流诱导应力的影响
目的研究疏水性和亲水性材料的倒装球栅阵列(FCBGA)封装在回流焊过程中的水致应力的流固耦合(FSI)分析。本文的目的是分析水分浓度和含疏水材料的FCBGA在不同时间对封装中感应压力和应力的影响。设计/方法/方法本研究通过视觉检测机(符合美国联合电子器件工程委员会标准)和FSI模拟,使用ANSYS/FLUENT软件包分析了回流过程中的翘曲变形。直接集中法用于建模水分扩散,ANSYS用于预测Von-Misses应力。进行了具有疏水性和亲水性材料组合的试验车辆1(类似于Xie等人,2009b)和试验车辆2(FCBGA封装)的模型。对不同水分浓度随回流过程时间的变化进行了模拟。结果机械可靠性研究的结果表明,FSI分析与已发表的研究结果一致,与实验结果一致。与具有亲水性材料的FCBGA相比,具有疏水性材料的FC BGA上由湿气引起的最大Von Misses应力显著增加。疏水性物质的存在阻碍了水分的解吸过程。分析还表明,水分很可能存在于电子封装中,并在饱和蒸汽之外发展为过热蒸汽或压缩液体,从而使电子封装暴露在更高的应力下。实际意义研究结果为微电子行业回流焊工艺中的工程师和封装设计师提供了有价值的指导和参考。独创性/价值关于水分浓度和疏水材料影响的研究仍然有限,涉及疏水和亲水材料影响的FCBGA封装在回流工艺下翘曲的研究很少报道。因此,这项研究对于有效弥合微电子行业的研究差距和制定适当的指导方针具有重要意义。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 去求助
来源期刊
Soldering & Surface Mount Technology
Soldering & Surface Mount Technology 工程技术-材料科学:综合
CiteScore
4.10
自引率
15.00%
发文量
30
审稿时长
>12 weeks
期刊介绍: Soldering & Surface Mount Technology seeks to make an important contribution to the advancement of research and application within the technical body of knowledge and expertise in this vital area. Soldering & Surface Mount Technology compliments its sister publications; Circuit World and Microelectronics International. The journal covers all aspects of SMT from alloys, pastes and fluxes, to reliability and environmental effects, and is currently providing an important dissemination route for new knowledge on lead-free solders and processes. The journal comprises a multidisciplinary study of the key materials and technologies used to assemble state of the art functional electronic devices. The key focus is on assembling devices and interconnecting components via soldering, whilst also embracing a broad range of related approaches.
期刊最新文献
Formation and growth mechanism of thin Cu6Sn5 films in Sn/Cu and Sn-0.1AlN/Cu structures using laser heating Influence of annealing temperature on 3D surface stereometric analysis in C-Ni films Effect of different beam distances in laser soldering process: a numerical and experimental study Interfacial IMC growth behavior of Sn-3Ag-3Sb-xIn solder on Cu substrate Effects of Ni addition on wettability and interfacial microstructure of Sn-0.7Cu-xNi solder alloy
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1