Cu3Sn-microporous copper composite joint for high-temperature die-attach applications

IF 1.7 4区 材料科学 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC Soldering & Surface Mount Technology Pub Date : 2021-10-04 DOI:10.1108/ssmt-07-2021-0047
Zhenya Pan, F. Sun
{"title":"Cu3Sn-microporous copper composite joint for high-temperature die-attach applications","authors":"Zhenya Pan, F. Sun","doi":"10.1108/ssmt-07-2021-0047","DOIUrl":null,"url":null,"abstract":"\nPurpose\nThe purpose of this paper is to design a novel die-attach composite joint for high-temperature die-attach applications based on transient liquid phase bonding. Moreover, the microstructure, shear strength, electrical property, thermal conductivity and aging property of the composite joint were investigated.\n\n\nDesign/methodology/approach\nThe composite joint was made of microporous copper and Cu3Sn. Microporous copper was immersed into liquid Sn to achieve Sn-microporous copper composite structure for die attachment. By the thermo-compression bonding, the Cu3Sn-microporous copper composite joint with a thickness of 100 µm was successfully obtained after bonding at 350 °C for 5 min under a low pressure of 0.6 MPa.\n\n\nFindings\nAfter thermo-compression bonding, the resulting interconnection could withstand a high temperature of at most 676 °C, with the entire Sn transforming into Cu3Sn with high remelting temperatures. A large shear strength could be achieved with the Cu3Sn-microporous copper in the interconnections. The formed bondlines demonstrated a good electrical and thermal conductivity owing to the large existing amount of copper in the interconnections. Furthermore, the interconnection also exhibited excellent reliability under high temperature aging at 300 °C.\n\n\nOriginality/value\nThis die-attach composite joint was suitable for power devices operating under high temperatures or other harsh environments.\n","PeriodicalId":49499,"journal":{"name":"Soldering & Surface Mount Technology","volume":" ","pages":""},"PeriodicalIF":1.7000,"publicationDate":"2021-10-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Soldering & Surface Mount Technology","FirstCategoryId":"88","ListUrlMain":"https://doi.org/10.1108/ssmt-07-2021-0047","RegionNum":4,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
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Abstract

Purpose The purpose of this paper is to design a novel die-attach composite joint for high-temperature die-attach applications based on transient liquid phase bonding. Moreover, the microstructure, shear strength, electrical property, thermal conductivity and aging property of the composite joint were investigated. Design/methodology/approach The composite joint was made of microporous copper and Cu3Sn. Microporous copper was immersed into liquid Sn to achieve Sn-microporous copper composite structure for die attachment. By the thermo-compression bonding, the Cu3Sn-microporous copper composite joint with a thickness of 100 µm was successfully obtained after bonding at 350 °C for 5 min under a low pressure of 0.6 MPa. Findings After thermo-compression bonding, the resulting interconnection could withstand a high temperature of at most 676 °C, with the entire Sn transforming into Cu3Sn with high remelting temperatures. A large shear strength could be achieved with the Cu3Sn-microporous copper in the interconnections. The formed bondlines demonstrated a good electrical and thermal conductivity owing to the large existing amount of copper in the interconnections. Furthermore, the interconnection also exhibited excellent reliability under high temperature aging at 300 °C. Originality/value This die-attach composite joint was suitable for power devices operating under high temperatures or other harsh environments.
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用于高温模具连接应用的Cu3Sn微孔铜复合接头
目的设计一种新型的基于瞬态液相键合的高温模贴复合接头。研究了复合材料接头的显微组织、抗剪强度、电学性能、导热性能和老化性能。设计/方法/方法采用微孔铜和Cu3Sn材料制备复合接头。将微孔铜浸入到锡液中,得到锡-微孔铜复合结构,用于模具附着。通过热压键合,在0.6 MPa的低压下,在350℃下键合5min,成功获得了厚度为100µm的cu3sn -微孔铜复合接头。热压缩键合后,得到的互连可以承受高达676℃的高温,整个Sn在高重熔温度下转变为Cu3Sn。采用cu3sn微孔铜作为连接材料可以获得较高的抗剪强度。由于在互连中存在大量的铜,形成的键线表现出良好的导电性和导热性。此外,在300°C高温老化下,互连也表现出优异的可靠性。独创性/价值该模贴式复合接头适用于在高温或其他恶劣环境下工作的电力设备。
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来源期刊
Soldering & Surface Mount Technology
Soldering & Surface Mount Technology 工程技术-材料科学:综合
CiteScore
4.10
自引率
15.00%
发文量
30
审稿时长
>12 weeks
期刊介绍: Soldering & Surface Mount Technology seeks to make an important contribution to the advancement of research and application within the technical body of knowledge and expertise in this vital area. Soldering & Surface Mount Technology compliments its sister publications; Circuit World and Microelectronics International. The journal covers all aspects of SMT from alloys, pastes and fluxes, to reliability and environmental effects, and is currently providing an important dissemination route for new knowledge on lead-free solders and processes. The journal comprises a multidisciplinary study of the key materials and technologies used to assemble state of the art functional electronic devices. The key focus is on assembling devices and interconnecting components via soldering, whilst also embracing a broad range of related approaches.
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