Low Area and High Bit Resolution Flash Analog to Digital Converter for Wide Band Applications: A Review

Q3 Engineering Micro and Nanosystems Pub Date : 2021-08-20 DOI:10.2174/1876402913666210820111312
B. Krishna, S. S. Gill, Amod Kumar
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引用次数: 3

Abstract

This work reviews the design challenges of CMOS flash type analog-to-digital converter (ADC) for making high bit resolution, low area, low noise, low offset, and power-efficient architecture. Low-bit resolution flash ADC architecture, high-speed applications, and wide-area parallel comparators are identified on their suitability of the design for ADCs. These are effective in the area and bit resolution. The overview includes bit resolution, area, power dissipation, bandwidth and offset noise consideration for high-speed flash ADC design. A MUX-based two-step half flash architecture is considered for applications requiring 1 GHz 16-bit resolution low area and low power consumption. An advanced comparator, MUX, a high-speed digital-to-analog converter(DAC), and MUX-based encoder are also reviewed. The design of technology-efficient ADC architecture is highly challenging for the analog designer.
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宽带应用的低面积高位分辨率闪存模数转换器:综述
本工作回顾了CMOS闪存型模数转换器(ADC)的设计挑战,以实现高位分辨率、低面积、低噪声、低偏移和节能架构。低位分辨率闪存ADC架构、高速应用和广域并行比较器被确定为ADC设计的适用性。这在面积和钻头分辨率上都是有效的。概述包括位分辨率、面积、功耗、带宽和对高速闪存ADC设计的偏移噪声考虑。基于mux的两步半闪存架构被考虑用于需要1 GHz 16位分辨率、低面积和低功耗的应用。一个先进的比较器,MUX,一个高速数模转换器(DAC),和MUX为基础的编码器也进行了审查。设计技术高效的ADC架构对模拟设计人员来说是极具挑战性的。
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来源期刊
Micro and Nanosystems
Micro and Nanosystems Engineering-Building and Construction
CiteScore
1.60
自引率
0.00%
发文量
50
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