Investigation of Quantum Conductance in Silicon Nanowire Doped with Boron in the Presence and Absence of (3-Aminopropyl) Triethoxysilane Molecule

IF 1.4 4区 综合性期刊 Q2 MULTIDISCIPLINARY SCIENCES Iranian Journal of Science and Technology, Transactions A: Science Pub Date : 2023-07-25 DOI:10.1007/s40995-023-01501-y
Rahele Masoumifard, Mohsen Oftadeh, Kiamars Eskandari
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Abstract

Calculations of the band structure and quantum conductance of silicon nanowires (SiNW’s) in different space configurations with and without (3-aminopropyl) triethoxysilane (APTES) in different structures of ordinary and B-doped were investigated using Quantum Espresso and Wannier90 computational codes. By adding 1/27 impurities to the SiNW, the Si-B-Si bond angle at the shell increased by 120.75°, and the bond angle decreased to 107.05° for the core atoms. By adding APTES to the system, the Si–Si–Si bonding angle of the shell atoms increased to 110.12°. The band structure of pure SiNW based on maximally localized Wannier functions in the \(Z - \Gamma - X\) direction in two different energy ranges of − 6 to + 6 eV and − 2 to + 3 eV showed that the transported probability in the \(\Gamma - X\) direction is shallow. In the SiNW-B-doped band structure, nanowire contamination causes a p-type semiconductor in the system corresponding to about 3.8 eV for the energy gap, larger than the normal SiNW of about 0.7 eV. There is also an immense Van-Hoff singularity near the edge of the doped SiNW-B conduction band. In normal nanowires, the energy gap is smaller than that of doped nanowires, and the gap type changes from indirect to direct. In SiNW-doped films, the quantum conductance around the Fermi energy increases. In the SiNW-APTES system, owing to the presence of the APTES molecule, it is observed as a p-type semiconductor, and the conduction region and capacity of Van-Hoff singularities are more intense.

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(3-氨基丙基)三乙氧基硅烷存在和不存在情况下掺杂硼硅纳米线量子电导的研究
利用quantum Espresso和Wannier90计算程序,研究了在不同空间构型下,添加和不添加(3-氨基丙基)三乙氧基硅烷(APTES)的硅纳米线(SiNW’s)的能带结构和量子电导。在SiNW中加入1/27的杂质,壳层的Si-B-Si键角增加了120.75°,核心原子的键角减小到107.05°。在体系中加入APTES后,壳层原子的Si-Si-Si键角增加到110.12°。在−6 ~ + 6 eV和−2 ~ + 3 eV两个不同能量范围内,基于最大定域万尼尔函数的纯SiNW在\(Z - \Gamma - X\)方向的能带结构表明,\(\Gamma - X\)方向的输运概率较浅。在掺杂SiNW- b的能带结构中,纳米线污染导致体系中p型半导体对应约3.8 eV的能隙,比正常SiNW约0.7 eV的能隙大。在掺杂的SiNW-B导带边缘附近也存在一个巨大的范霍夫奇点。在正常纳米线中,能隙比掺杂纳米线小,且能隙类型由间接变为直接。在掺杂sinw的薄膜中,费米能量周围的量子电导增加。在SiNW-APTES体系中,由于APTES分子的存在,它被观察到为p型半导体,并且范-霍夫奇点的传导区和容量更强。
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来源期刊
CiteScore
4.00
自引率
5.90%
发文量
122
审稿时长
>12 weeks
期刊介绍: The aim of this journal is to foster the growth of scientific research among Iranian scientists and to provide a medium which brings the fruits of their research to the attention of the world’s scientific community. The journal publishes original research findings – which may be theoretical, experimental or both - reviews, techniques, and comments spanning all subjects in the field of basic sciences, including Physics, Chemistry, Mathematics, Statistics, Biology and Earth Sciences
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