A review of the dual-wavelength technique for phase imaging and 3D topography

Haowen Zhou, M. M. R. Hussain, P. Banerjee
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引用次数: 12

Abstract

Optically transmissive and reflective objects may have varying surface profiles, which translate to arbitrary phase profiles for light either transmitted through or reflected from the object. For high-throughput applications, resolving arbitrary phases and absolute heights is a key problem. To extend the ability of measuring absolute phase jumps in existing 3D imaging techniques, the dual-wavelength concept, proposed in late 1800s, has been developed in the last few decades. By adopting an extra wavelength in measurements, a synthetic wavelength, usually larger than each of the single wavelengths, can be simulated to extract large phases or height variations from micron-level to tens of centimeters scale. We review a brief history of the developments in the dualwavelength technique and present the methodology of this technique for using the phase difference and/or the phase sum. Various applications of the dual-wavelength technique are discussed, including height feature extraction from micron scale to centimeter scale in holography and interferometry, single-shot dual-wavelength digital holography for high-speed imaging, nanometer height resolution with fringe subdivision method, and applications in other novel phase imaging techniques and optical modalities. The noise sources for dualwavelength techniques for phase imaging and 3D topography are discussed, and potential ways to reduce or remove the noise are mentioned.
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相位成像和三维形貌的双波长技术综述
光学透射和反射物体可能具有不同的表面轮廓,对于通过该物体或从该物体反射的光,其表面轮廓可转换为任意相位轮廓。对于高通量应用,解决任意相位和绝对高度是关键问题。为了在现有的三维成像技术中扩展测量绝对相位跳变的能力,双波长概念在19世纪后期被提出,在过去的几十年里得到了发展。通过在测量中采用一个额外的波长,可以模拟一个通常大于单个波长的合成波长,以提取从微米级到几十厘米尺度的大相位或高度变化。我们回顾了双波长技术发展的简要历史,并介绍了该技术使用相位差和/或相和的方法。讨论了双波长技术的各种应用,包括全息和干涉测量中从微米尺度到厘米尺度的高度特征提取,用于高速成像的单镜头双波长数字全息,采用条纹细分方法的纳米高度分辨率,以及在其他新型相位成像技术和光学模式中的应用。讨论了相位成像和三维地形成像双波长技术的噪声源,并提出了降低或消除噪声的潜在方法。
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CiteScore
10.90
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0.00%
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