Temperature dependence of the electrical performance of SrBi/sub 2/Ta/sub 2/O/sub 9/ for non-volatile memory applications

D. Taylor, R.E. Jones, P. Chu, P. Zurcher, B. White, S. Zafar, S. J. Gillespie
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Abstract

Studies of the temperature dependence of many of the important electrical properties of SBT are presented. These include: (a) the remanent polarization (2P/sub r/), the non-volatile polarization (P/sub nv/), and the coercive field (E/sub C/) all of which are studied as functions of the pulse amplitude; (b) fatigue resistance of 2P/sub r/ and P/sub nv/; (c) the retention; and (d) the current versus voltage behavior. These studies demonstrate that SBT looks very promising for ferroelectric non-volatile memories over the consumer application range (0 to 70/spl deg/C).
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非易失性存储器SrBi/sub 2/Ta/sub 2/O/sub 9/电性能的温度依赖性
对SBT的许多重要电性能的温度依赖性进行了研究。这些包括:(a)剩余极化(2P/sub r/)、非挥发性极化(P/sub nv/)和矫顽力场(E/sub C/),它们都是脉冲振幅的函数;(b) 2P/sub r/和P/sub nv/的抗疲劳性能;(c)保留;(d)电流与电压的关系。这些研究表明,SBT在消费者应用范围(0到70/spl度/C)内对于铁电非易失性存储器看起来非常有前途。
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