The effect of doping and grain size on electrostriction in PbZr/sub 0.52/TiO/sub 0.48/O/sub 3/

V. Sundar, N. Kim, C. Randall, R. Yimnirun, R. Newnham
{"title":"The effect of doping and grain size on electrostriction in PbZr/sub 0.52/TiO/sub 0.48/O/sub 3/","authors":"V. Sundar, N. Kim, C. Randall, R. Yimnirun, R. Newnham","doi":"10.1109/ISAF.1996.598180","DOIUrl":null,"url":null,"abstract":"The electromechanical properties of undoped PbZr/sub 0.52/Ti/sub 0.48/O/sub 3/ (PZT 52/48) samples in a size range 0.7-14 /spl mu/ were studied as a function of the grain size. Internal bias fields were found to have significant effects on the dielectric and piezoelectric behavior samples. Strains from domain reorientation caused hysteresis in the strain vs. polarization curves. It was necessary to filter out these contributions in order to study the variation in Q/sub 33/, the average ceramic electrostriction coefficient, with grain size. Q/sub 33/ varied from 2.44m/sup 4//C/sup 2/ at 14 /spl mu/ to 2.04 m/sup 4//C/sup 2/ at 0.7 /spl mu/. An apparent critical size of 2.4 /spl mu/ was observed for Q/sub 33/. The suppression of the maximum dielectric constant for PZT 52/48 at the Curie Temperature may be related to the changes in grain size through the electrostrictive effects of clamping stresses.","PeriodicalId":14772,"journal":{"name":"ISAF '96. Proceedings of the Tenth IEEE International Symposium on Applications of Ferroelectrics","volume":"31 1","pages":"935-938 vol.2"},"PeriodicalIF":0.0000,"publicationDate":"1996-08-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"ISAF '96. Proceedings of the Tenth IEEE International Symposium on Applications of Ferroelectrics","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISAF.1996.598180","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2

Abstract

The electromechanical properties of undoped PbZr/sub 0.52/Ti/sub 0.48/O/sub 3/ (PZT 52/48) samples in a size range 0.7-14 /spl mu/ were studied as a function of the grain size. Internal bias fields were found to have significant effects on the dielectric and piezoelectric behavior samples. Strains from domain reorientation caused hysteresis in the strain vs. polarization curves. It was necessary to filter out these contributions in order to study the variation in Q/sub 33/, the average ceramic electrostriction coefficient, with grain size. Q/sub 33/ varied from 2.44m/sup 4//C/sup 2/ at 14 /spl mu/ to 2.04 m/sup 4//C/sup 2/ at 0.7 /spl mu/. An apparent critical size of 2.4 /spl mu/ was observed for Q/sub 33/. The suppression of the maximum dielectric constant for PZT 52/48 at the Curie Temperature may be related to the changes in grain size through the electrostrictive effects of clamping stresses.
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掺杂和晶粒尺寸对PbZr/sub 0.52/TiO/sub 0.48/O/sub 3/中电致伸缩的影响
研究了未掺杂PbZr/sub 0.52/Ti/sub 0.48/O/sub 3/ (pzt52 /48)样品在0.7 ~ 14 /spl mu/范围内的机电性能随晶粒尺寸的变化规律。发现内部偏置场对样品的介电和压电性能有显著影响。畴重取向引起的应变-极化曲线出现迟滞现象。为了研究平均陶瓷电致伸缩系数Q/sub 33/随晶粒尺寸的变化,有必要滤除这些贡献。Q/ sub33 /从2.44m/sup 4//C/sup 2/在14 /spl mu/到2.04 m/sup 4//C/sup 2/在0.7 /spl mu/。Q/sub 33/的表观临界尺寸为2.4 /spl mu/。居里温度下pzt52 /48的最大介电常数的抑制可能与箝位应力的电致伸缩效应导致晶粒尺寸的变化有关。
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