{"title":"Numerical Analysis of Low-Voltage Circuit-Breakers under Short-Circuit Conditions","authors":"T. Mutzel, F. Berger, M. Anheuser","doi":"10.1109/HOLM.2007.4318192","DOIUrl":null,"url":null,"abstract":"Short-circuits in electrical networks come along with severe mechanical and thermal stresses not only to loads and systems, but also to the installed protection devices. Combined analytical simulations have been performed for analyzing and optimizing the behavior of low-voltage circuit-breakers. Especially circuit-breakers with electronic tripping units have been scrutinized.","PeriodicalId":11624,"journal":{"name":"Electrical Contacts - 2007 Proceedings of the 53rd IEEE Holm Conference on Electrical Contacts","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2007-09-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Electrical Contacts - 2007 Proceedings of the 53rd IEEE Holm Conference on Electrical Contacts","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/HOLM.2007.4318192","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 4
Abstract
Short-circuits in electrical networks come along with severe mechanical and thermal stresses not only to loads and systems, but also to the installed protection devices. Combined analytical simulations have been performed for analyzing and optimizing the behavior of low-voltage circuit-breakers. Especially circuit-breakers with electronic tripping units have been scrutinized.
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