Pub Date : 2007-09-24DOI: 10.1109/HOLM.2007.4318196
T. Tamai, Y. Hattori
Characteristics of conductive elastomer which is composed of silicone rubber and dispersed carbon black particles shows conductive and elastic properties in one simple material. This material has been widely applied to contacts of switches and connectors of a liquid crystal panels. However, since surface state of the contact is very soft, it is difficult to remove contaminant films of contaminated opposite side contact surface and to obtain low contact resistance owing to break the film. This study has been conducted to clear structures of the elastomer which indicates removal characteristics for contaminant films and low contact resistance. As specimens, six different types of the elastomer contacts composed by different type of dispersed such materials as carbon and metal fibers, metal mesh, and plated surfaces were used. The opposite contacts were Au and Sn plated contact surface on a printed circuit board (PCB). The elastomeric contacts contained hard materials showed lower contact resistance than only dispersed carbon particles in the elastomer matrix for both contaminated PCB contact surfaces.
{"title":"Contact Resistance Characteristics of Elastomeric Complex Structure Contacts for Gold and Tin Printed Circuit Board","authors":"T. Tamai, Y. Hattori","doi":"10.1109/HOLM.2007.4318196","DOIUrl":"https://doi.org/10.1109/HOLM.2007.4318196","url":null,"abstract":"Characteristics of conductive elastomer which is composed of silicone rubber and dispersed carbon black particles shows conductive and elastic properties in one simple material. This material has been widely applied to contacts of switches and connectors of a liquid crystal panels. However, since surface state of the contact is very soft, it is difficult to remove contaminant films of contaminated opposite side contact surface and to obtain low contact resistance owing to break the film. This study has been conducted to clear structures of the elastomer which indicates removal characteristics for contaminant films and low contact resistance. As specimens, six different types of the elastomer contacts composed by different type of dispersed such materials as carbon and metal fibers, metal mesh, and plated surfaces were used. The opposite contacts were Au and Sn plated contact surface on a printed circuit board (PCB). The elastomeric contacts contained hard materials showed lower contact resistance than only dispersed carbon particles in the elastomer matrix for both contaminated PCB contact surfaces.","PeriodicalId":11624,"journal":{"name":"Electrical Contacts - 2007 Proceedings of the 53rd IEEE Holm Conference on Electrical Contacts","volume":"12 1","pages":"63-69"},"PeriodicalIF":0.0,"publicationDate":"2007-09-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"79750431","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2007-09-24DOI: 10.1109/HOLM.2007.4318201
Xin Zhou, J. Shea
Glowing contacts are an interesting and complex phenomenon. They may be associated with residential arc faults and fire hazards. Previous investigation has shown that formation needs certain environmental and current conditions. The aim of this paper is to provide further understanding of their formation mechanism. Optical emission spectroscopy was employed to investigate the state of gases along the glowing contact surface. A high-speed video camera was used to observe glowing contact behavior at frame rates up to 150 fps. Based on emission spectroscopy and high-speed video images, analysis was carried out into the mechanism for current conduction at the contact interface. These results were correlated to glowing contact behavior at different current levels and three modes were identified.
{"title":"Characterization of Glowing Contacts using Optical Emission Spectroscopy","authors":"Xin Zhou, J. Shea","doi":"10.1109/HOLM.2007.4318201","DOIUrl":"https://doi.org/10.1109/HOLM.2007.4318201","url":null,"abstract":"Glowing contacts are an interesting and complex phenomenon. They may be associated with residential arc faults and fire hazards. Previous investigation has shown that formation needs certain environmental and current conditions. The aim of this paper is to provide further understanding of their formation mechanism. Optical emission spectroscopy was employed to investigate the state of gases along the glowing contact surface. A high-speed video camera was used to observe glowing contact behavior at frame rates up to 150 fps. Based on emission spectroscopy and high-speed video images, analysis was carried out into the mechanism for current conduction at the contact interface. These results were correlated to glowing contact behavior at different current levels and three modes were identified.","PeriodicalId":11624,"journal":{"name":"Electrical Contacts - 2007 Proceedings of the 53rd IEEE Holm Conference on Electrical Contacts","volume":"21 1","pages":"98-104"},"PeriodicalIF":0.0,"publicationDate":"2007-09-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"85820506","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2007-09-24DOI: 10.1109/HOLM.2007.4318223
D. Sallais, N. Ben Jemaa, E. Carvou
Speed separation in switches and relays is a fundamental parameter to improve breaking devices performances by reducing extinction gap and arc duration. It is commonly admitted, that with resistive load, high speed separation produces lower arc duration and keeps constant extinction gap, whereas with inductive load, the extinction gap is enlarged. The objective of this paper is to minimize the gap in a wide opening speed range (from 1 cm/s to 1 m/s) covering the main application of breaking and disconnecting devices. The results reveal a minimum arc extinction gap that occurred at an opening speed close to a few cm/s. Contrary to the common idea, this new result shows that high separation speeds are not always required to minimize the gap. In addition, this minimum gap value is highly affected by load and current, while contact materials seem to have a minor action. Based on arc shape and plasma examination, some attempts are made to explain this gap contraction.
{"title":"Minimization of arc extinction gap in the opening speed range 1 cm/s - 1 m/s","authors":"D. Sallais, N. Ben Jemaa, E. Carvou","doi":"10.1109/HOLM.2007.4318223","DOIUrl":"https://doi.org/10.1109/HOLM.2007.4318223","url":null,"abstract":"Speed separation in switches and relays is a fundamental parameter to improve breaking devices performances by reducing extinction gap and arc duration. It is commonly admitted, that with resistive load, high speed separation produces lower arc duration and keeps constant extinction gap, whereas with inductive load, the extinction gap is enlarged. The objective of this paper is to minimize the gap in a wide opening speed range (from 1 cm/s to 1 m/s) covering the main application of breaking and disconnecting devices. The results reveal a minimum arc extinction gap that occurred at an opening speed close to a few cm/s. Contrary to the common idea, this new result shows that high separation speeds are not always required to minimize the gap. In addition, this minimum gap value is highly affected by load and current, while contact materials seem to have a minor action. Based on arc shape and plasma examination, some attempts are made to explain this gap contraction.","PeriodicalId":11624,"journal":{"name":"Electrical Contacts - 2007 Proceedings of the 53rd IEEE Holm Conference on Electrical Contacts","volume":"22 1","pages":"239-243"},"PeriodicalIF":0.0,"publicationDate":"2007-09-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"82098802","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2007-09-24DOI: 10.1109/HOLM.2007.4318221
F. Xie, G. Flowers, Chen Chen, M. Bozack, J. Suhling, B. Rickett, R. Malucci, C. Manlapaz
Connector fretting propensity is generally evaluated through an exhaustive series of experimental tests, making the connector design and validation process time consuming and costly. Thus, a method using modeling and simulation techniques to predict the influence of various design factors on vibration-induced fretting propensity in electrical connectors method would very beneficial to those responsible for connector design and application. One approach is to use detailed finite element models for the connector system to relate the actual dynamics of the contact interface to the threshold vibration levels required for the onset of fretting and the relative motion transfer function. The present study describes one such model for a single tin-plated blade/receptacle connector pair. Concurrent simulation and experimental studies were performed to evaluate the threshold vibration levels as a function of excitation frequency, interface friction coefficient, and normal force. Good correlation between the experimentally observed results and those predicted by the models was obtained. Some insights and observations with regard to the effectiveness of such a modeling approach are also presented.
{"title":"Analysis and Prediction of Vibration-Induced Fretting Motion in a Blade/Receptacle Connector Pair","authors":"F. Xie, G. Flowers, Chen Chen, M. Bozack, J. Suhling, B. Rickett, R. Malucci, C. Manlapaz","doi":"10.1109/HOLM.2007.4318221","DOIUrl":"https://doi.org/10.1109/HOLM.2007.4318221","url":null,"abstract":"Connector fretting propensity is generally evaluated through an exhaustive series of experimental tests, making the connector design and validation process time consuming and costly. Thus, a method using modeling and simulation techniques to predict the influence of various design factors on vibration-induced fretting propensity in electrical connectors method would very beneficial to those responsible for connector design and application. One approach is to use detailed finite element models for the connector system to relate the actual dynamics of the contact interface to the threshold vibration levels required for the onset of fretting and the relative motion transfer function. The present study describes one such model for a single tin-plated blade/receptacle connector pair. Concurrent simulation and experimental studies were performed to evaluate the threshold vibration levels as a function of excitation frequency, interface friction coefficient, and normal force. Good correlation between the experimentally observed results and those predicted by the models was obtained. Some insights and observations with regard to the effectiveness of such a modeling approach are also presented.","PeriodicalId":11624,"journal":{"name":"Electrical Contacts - 2007 Proceedings of the 53rd IEEE Holm Conference on Electrical Contacts","volume":"16 1","pages":"222-228"},"PeriodicalIF":0.0,"publicationDate":"2007-09-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"87871250","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2007-09-24DOI: 10.1109/HOLM.2007.4318207
Xingwen Li, Degui Chen, M. Rong, Ruicheng Dai
The arc is one kind of mixture plasma containing air and metallic vapour (Cu, Ag, Fe, etc.) in low voltage circuit breaker. The metallic vapour has important influence on arc characteristics because the properties of the mixture plasma are different with the ones of the pure air. The influence of Cu vapour on air arc characteristics is investigated in the paper. Firstly, commercial computational fluid dynamics software FLUENT is adapted and modified to develop the two- dimensional magneto-hydrodynamic (MHD) models of arc with the thermodynamic and transport properties, net emission coefficient for radiation model of 99% Air-1% Cu and pure air, respectively. Then, relevant experiments are carried out to verify the models by measuring the arc motion average velocities with 2-D optical fiber measurement system. It demonstrates that with the influence of Cu vapour, the arc center temperature is lower and the arc motion is slower.
{"title":"Study of the Influence of Cu Vapour on Air Arc Characteristics","authors":"Xingwen Li, Degui Chen, M. Rong, Ruicheng Dai","doi":"10.1109/HOLM.2007.4318207","DOIUrl":"https://doi.org/10.1109/HOLM.2007.4318207","url":null,"abstract":"The arc is one kind of mixture plasma containing air and metallic vapour (Cu, Ag, Fe, etc.) in low voltage circuit breaker. The metallic vapour has important influence on arc characteristics because the properties of the mixture plasma are different with the ones of the pure air. The influence of Cu vapour on air arc characteristics is investigated in the paper. Firstly, commercial computational fluid dynamics software FLUENT is adapted and modified to develop the two- dimensional magneto-hydrodynamic (MHD) models of arc with the thermodynamic and transport properties, net emission coefficient for radiation model of 99% Air-1% Cu and pure air, respectively. Then, relevant experiments are carried out to verify the models by measuring the arc motion average velocities with 2-D optical fiber measurement system. It demonstrates that with the influence of Cu vapour, the arc center temperature is lower and the arc motion is slower.","PeriodicalId":11624,"journal":{"name":"Electrical Contacts - 2007 Proceedings of the 53rd IEEE Holm Conference on Electrical Contacts","volume":"70 1","pages":"140-145"},"PeriodicalIF":0.0,"publicationDate":"2007-09-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"86256671","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2007-09-24DOI: 10.1109/HOLM.2007.4318228
K. Koibuchi, K. Sawa
Accurate determinations of contact resistance (which contains constriction and film resistance) and temperature rise are most conventional and important issues of electric conduction devices. This paper investigates coupled analysis of current and thermal distributions of Ag electrode by FEM. Intended final results are to obtain constriction resistance and temperature values. Contact areas (a-spot) of spherical and flat shaped Ag electrodes are discretized to a large number of narrow finite elements. Firstly, current density distributions in each element are calculated by FEM, and contact resistance values are obtained from the impressed current and electric potential difference between the anode and cathode. Compared with the theoretical results by R. Holm's equation for constriction resistance, calculated contact resistance values of several a-spot radii show fine agreement. Local Joule heat distributions are also obtained. Moreover, thermal distributions in the electrodes are shown as the calculated results. As a quantitative verification, tendency of maximum temperature of the calculated results shows good agreement with phi-thetas theory by R. Holm.
{"title":"Numerical study on current and thermal distributions of electrical contacts by FEM","authors":"K. Koibuchi, K. Sawa","doi":"10.1109/HOLM.2007.4318228","DOIUrl":"https://doi.org/10.1109/HOLM.2007.4318228","url":null,"abstract":"Accurate determinations of contact resistance (which contains constriction and film resistance) and temperature rise are most conventional and important issues of electric conduction devices. This paper investigates coupled analysis of current and thermal distributions of Ag electrode by FEM. Intended final results are to obtain constriction resistance and temperature values. Contact areas (a-spot) of spherical and flat shaped Ag electrodes are discretized to a large number of narrow finite elements. Firstly, current density distributions in each element are calculated by FEM, and contact resistance values are obtained from the impressed current and electric potential difference between the anode and cathode. Compared with the theoretical results by R. Holm's equation for constriction resistance, calculated contact resistance values of several a-spot radii show fine agreement. Local Joule heat distributions are also obtained. Moreover, thermal distributions in the electrodes are shown as the calculated results. As a quantitative verification, tendency of maximum temperature of the calculated results shows good agreement with phi-thetas theory by R. Holm.","PeriodicalId":11624,"journal":{"name":"Electrical Contacts - 2007 Proceedings of the 53rd IEEE Holm Conference on Electrical Contacts","volume":"60 1","pages":"269-274"},"PeriodicalIF":0.0,"publicationDate":"2007-09-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"80537374","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2007-09-24DOI: 10.1109/HOLM.2007.4318211
S. Noel, D. Alamarguy, F. Houzé, A. Benedetto, P. Viel, S. Palacin, N. Izard, P. Chenevier
Increased demands on reliability, operations in harsh environments and miniaturisation of electrical contacts, justify research on totally innovating coatings. Such films require many specific properties such as proper conduction and mechanical behaviour. The approach reported here is based on the idea of associating a polymer matrix and a conducting charge. The polymer matrix was chosen to resist mechanical degradation while the charge allows good conductivity. The first results obtained by associating a carbon nanotube (CNT) network to a fluorinated polymer thin layer are presented here. Several characterisation techniques such as XPS, FT-IR and Raman spectroscopy have allowed the control of the various steps of the elaboration process. Films were deposited on cuprous coupons with a nickel underlayer and an electrodeposited gold final layer. Several matrixes were studied. The properties of these thin films were investigated in a ball plane contact configuration: first electrical and mechanical characterisations show low values of contact resistance and friction coefficient. The CNT network influence is investigated both at a macroscopic scale and at a microscopic one.
{"title":"Nanocomposite thin films for surface protection in electrical contact applications","authors":"S. Noel, D. Alamarguy, F. Houzé, A. Benedetto, P. Viel, S. Palacin, N. Izard, P. Chenevier","doi":"10.1109/HOLM.2007.4318211","DOIUrl":"https://doi.org/10.1109/HOLM.2007.4318211","url":null,"abstract":"Increased demands on reliability, operations in harsh environments and miniaturisation of electrical contacts, justify research on totally innovating coatings. Such films require many specific properties such as proper conduction and mechanical behaviour. The approach reported here is based on the idea of associating a polymer matrix and a conducting charge. The polymer matrix was chosen to resist mechanical degradation while the charge allows good conductivity. The first results obtained by associating a carbon nanotube (CNT) network to a fluorinated polymer thin layer are presented here. Several characterisation techniques such as XPS, FT-IR and Raman spectroscopy have allowed the control of the various steps of the elaboration process. Films were deposited on cuprous coupons with a nickel underlayer and an electrodeposited gold final layer. Several matrixes were studied. The properties of these thin films were investigated in a ball plane contact configuration: first electrical and mechanical characterisations show low values of contact resistance and friction coefficient. The CNT network influence is investigated both at a macroscopic scale and at a microscopic one.","PeriodicalId":11624,"journal":{"name":"Electrical Contacts - 2007 Proceedings of the 53rd IEEE Holm Conference on Electrical Contacts","volume":"128 1","pages":"160-166"},"PeriodicalIF":0.0,"publicationDate":"2007-09-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"90281108","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2007-09-24DOI: 10.1109/HOLM.2007.4318231
N. Miki, K. Sawa
The movement to the high frequency is strong in communication systems. But semiconductors used in such systems are known to have various problems in high frequency. Therefore an electromechanical switch of supreme RF (radio frequency) characteristics in the insertion loss and isolation is expected. However, in RF range, the arc characteristics generated between electric contacts have not been clarified. In this research, we examine basic characteristics of the breaking arc in high frequency especially the arc duration and the V-I characteristic. According to the results, it turned out that the arc duration becomes shorter and the arc voltage becomes lower as the frequency rises. Therefore, less damage is expected. Further, this experiment was conducted by interrupting the circuit current at its peak value, where arcing duration is shorter than T/4 which is the time of current zero. But after the arc extinction of current zero, reignition occurs over 600 kHz, then arc duration is longer than T/4. The reignition behavior is examined by measuring arc waveform in higher frequency.
{"title":"Breaking arc characteristics in various power supply frequencies","authors":"N. Miki, K. Sawa","doi":"10.1109/HOLM.2007.4318231","DOIUrl":"https://doi.org/10.1109/HOLM.2007.4318231","url":null,"abstract":"The movement to the high frequency is strong in communication systems. But semiconductors used in such systems are known to have various problems in high frequency. Therefore an electromechanical switch of supreme RF (radio frequency) characteristics in the insertion loss and isolation is expected. However, in RF range, the arc characteristics generated between electric contacts have not been clarified. In this research, we examine basic characteristics of the breaking arc in high frequency especially the arc duration and the V-I characteristic. According to the results, it turned out that the arc duration becomes shorter and the arc voltage becomes lower as the frequency rises. Therefore, less damage is expected. Further, this experiment was conducted by interrupting the circuit current at its peak value, where arcing duration is shorter than T/4 which is the time of current zero. But after the arc extinction of current zero, reignition occurs over 600 kHz, then arc duration is longer than T/4. The reignition behavior is examined by measuring arc waveform in higher frequency.","PeriodicalId":11624,"journal":{"name":"Electrical Contacts - 2007 Proceedings of the 53rd IEEE Holm Conference on Electrical Contacts","volume":"53 1","pages":"284-288"},"PeriodicalIF":0.0,"publicationDate":"2007-09-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"78150669","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2007-09-24DOI: 10.1109/HOLM.2007.4318217
T. Ueno, K. Kadono, N. Morita
Usually, sliding contact action is used to supply current to a rotating or a moving object. In the present experiment, we examined the relation between surface roughness condition and contact voltage drop for sliding contacts. We used carbon brush and copper slip ring for sliding materials. It is confirmed that the contact voltage drop is changed by various surface roughness of sliding materials. In case of the brush surface roughness is same as slip ring surface roughness, the contact voltage drop is increased. We consider that the real contact area affects the contact voltage drop change. In this paper, we examined mainly, the relation between sliding speed and surface roughness for electrical sliding contact action.
{"title":"Influence of Surface Roughness on Contact Voltage Drop of Electrical Sliding Contacts","authors":"T. Ueno, K. Kadono, N. Morita","doi":"10.1109/HOLM.2007.4318217","DOIUrl":"https://doi.org/10.1109/HOLM.2007.4318217","url":null,"abstract":"Usually, sliding contact action is used to supply current to a rotating or a moving object. In the present experiment, we examined the relation between surface roughness condition and contact voltage drop for sliding contacts. We used carbon brush and copper slip ring for sliding materials. It is confirmed that the contact voltage drop is changed by various surface roughness of sliding materials. In case of the brush surface roughness is same as slip ring surface roughness, the contact voltage drop is increased. We consider that the real contact area affects the contact voltage drop change. In this paper, we examined mainly, the relation between sliding speed and surface roughness for electrical sliding contact action.","PeriodicalId":11624,"journal":{"name":"Electrical Contacts - 2007 Proceedings of the 53rd IEEE Holm Conference on Electrical Contacts","volume":"21 1","pages":"200-204"},"PeriodicalIF":0.0,"publicationDate":"2007-09-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"72645631","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2007-09-24DOI: 10.1109/HOLM.2007.4318204
J. Aronstein
A new setscrew connector for residential aluminum wiring repair is evaluated by means of a static zero-current test, a high-current "heat cycle" test, an environmental test, and a wire disturbance test. Additionally, the current partitioning between the two paths between the wire and the connector body is determined. After a short time in service, the resistance of the direct contact between the wire and the connector body increases to the extent that most of the current flows from the wire to the connector body through the setscrew. Further connection resistance increase then occurs at an insignificant rate, resulting in a satisfactory long life projection. The connector resists contact deterioration from the wire disturbances that occur during installation, provided that the setscrews are fully tightened as specified. The connector must be tool-held to reliably achieve the required degree of tightening, however. The connector's corrosion inhibitor is found to be involved in the initial connection resistance increase. This connector is considered to be a satisfactory candidate for residential aluminum wire repair.
{"title":"Evaluation of a Setscrew Connector for Aluminum Wire","authors":"J. Aronstein","doi":"10.1109/HOLM.2007.4318204","DOIUrl":"https://doi.org/10.1109/HOLM.2007.4318204","url":null,"abstract":"A new setscrew connector for residential aluminum wiring repair is evaluated by means of a static zero-current test, a high-current \"heat cycle\" test, an environmental test, and a wire disturbance test. Additionally, the current partitioning between the two paths between the wire and the connector body is determined. After a short time in service, the resistance of the direct contact between the wire and the connector body increases to the extent that most of the current flows from the wire to the connector body through the setscrew. Further connection resistance increase then occurs at an insignificant rate, resulting in a satisfactory long life projection. The connector resists contact deterioration from the wire disturbances that occur during installation, provided that the setscrews are fully tightened as specified. The connector must be tool-held to reliably achieve the required degree of tightening, however. The connector's corrosion inhibitor is found to be involved in the initial connection resistance increase. This connector is considered to be a satisfactory candidate for residential aluminum wire repair.","PeriodicalId":11624,"journal":{"name":"Electrical Contacts - 2007 Proceedings of the 53rd IEEE Holm Conference on Electrical Contacts","volume":"59 1","pages":"123-129"},"PeriodicalIF":0.0,"publicationDate":"2007-09-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"88253718","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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