Influence of defects on insulating properties of XLPE cable

[1991] Proceedings of the 3rd International Conference on Properties and Applications of Dielectric Materials Pub Date : 1991-07-08 DOI:10.1109/ICPADM.1991.172103

G. Katsuta, A. Toya, S. Katakai, M. Kanaoka, Y. Sekii

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引用次数: 19

Abstract

The influence of defects on the insulating properties of XLPE (cross-linked polyethylene) cables was studied using XLPE cables containing artificial defects. It was confirmed that the AC breakdown strength of the cables decreases with the increase of void size, while the existence of voids does not have any effect on impulse breakdown strength. The contaminants and the protrusions decrease both AC and impulse breakdown strengths. The value of the life exponent, n, of the V-t characteristics of the XLPE cable containing voids was estimated to be smaller than that of the cables containing contaminants or protrusions. In addition to to the influence of those defects on initial and long-term performance of the cables, the influence of impulse voltage on the long-term performance of the cable, together with the behavior of the space charge accumulated around the defects, was investigated. It was found that impulse voltage greatly affects the long-term performance of cables containing voids.<>

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缺陷对交联聚乙烯电缆绝缘性能的影响

采用含人工缺陷的交联聚乙烯(XLPE)电缆，研究了缺陷对交联聚乙烯电缆绝缘性能的影响。结果表明，随着空隙尺寸的增大，电缆的交流击穿强度降低，而空隙的存在对冲击击穿强度没有影响。污染物和突出物降低了交流击穿强度和脉冲击穿强度。估计含孔洞的交联聚乙烯电缆的V-t特性寿命指数n值小于含污染物或突出物的电缆。除了研究这些缺陷对电缆初始性能和长期性能的影响外，还研究了冲击电压对电缆长期性能的影响，以及缺陷周围空间电荷的累积行为。研究发现，冲击电压对含孔洞电缆的长期性能影响很大。

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[1991] Proceedings of the 3rd International Conference on Properties and Applications of Dielectric Materials

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