Quantum transport property in FETs with deterministically implanted single-arsenic ions using single-ion implantation

M. Hori, T. Shinada, F. Guagliardo, G. Ferrari, E. Prati
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引用次数: 3

Abstract

We fabricated silicon transistors containing two and six arsenic ions implanted in one dimensional array along the channel by single-ion implantation method. The quantum transport was measured through the D0 and D- states of the arsenic ions at low temperature. We observed two different quantum transport regimes from the individual donor regime to the intermediate doping regime in which Hubbard bands are formed in agreement with the theoretical models. These results indicate that our deterministic single-ion doping method is more effective and reliable for single-dopant transistor development and pave the way towards single atom electronics for extended CMOS applications [12].
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用单离子注入确定注入单砷离子的场效应管的量子输运性质
采用单离子注入法制备了含2个和6个砷离子沿通道一维阵列注入的硅晶体管。在低温下,通过砷离子的D0态和D-态测量了量子输运。我们观察到两种不同的量子输运制度,从单个供体制度到中间掺杂制度,其中哈伯德带的形成与理论模型一致。这些结果表明,我们的确定性单离子掺杂方法对于单掺杂晶体管的开发更加有效和可靠,并为扩展CMOS应用的单原子电子学铺平了道路。
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Statistical variability study of a 10nm gate length SOI FinFET device A novel gate-all-around ultra-thin p-channel poly-Si TFT functioning as transistor and flash memory with silicon nanocrystals Quantum transport property in FETs with deterministically implanted single-arsenic ions using single-ion implantation Graphene fillers for ultra-efficient thermal interface materials Reduced drain current variability in fully depleted silicon-on-thin-BOX (SOTB) MOSFETs
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