N. R. Sorensen, E. Thomas, M. Quintana, S. Barkaszi, A. Rosenthal, Zhen Zhang, S. Kurtz
{"title":"Thermal study of inverter components","authors":"N. R. Sorensen, E. Thomas, M. Quintana, S. Barkaszi, A. Rosenthal, Zhen Zhang, S. Kurtz","doi":"10.1109/pvsc-vol2.2013.6656783","DOIUrl":null,"url":null,"abstract":"Thermal histories of inverter components were collected from operating inverters from several manufacturers and three locations. The data were analyzed to determine thermal profiles, the dependence on local conditions, and to assess the effect on inverter reliability. Inverter temperatures were shown to increase with the power dissipation of the inverters, follow diurnal and annual cycles, and have a dependence on wind speed. An accumulated damage model was applied to the temperature profiles and an example of using these data to predict reliability was explored.","PeriodicalId":6420,"journal":{"name":"2012 IEEE 38th Photovoltaic Specialists Conference (PVSC) PART 2","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2013-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2012 IEEE 38th Photovoltaic Specialists Conference (PVSC) PART 2","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/pvsc-vol2.2013.6656783","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 4
Abstract
Thermal histories of inverter components were collected from operating inverters from several manufacturers and three locations. The data were analyzed to determine thermal profiles, the dependence on local conditions, and to assess the effect on inverter reliability. Inverter temperatures were shown to increase with the power dissipation of the inverters, follow diurnal and annual cycles, and have a dependence on wind speed. An accumulated damage model was applied to the temperature profiles and an example of using these data to predict reliability was explored.
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