{"title":"VLSI performance metric based on minimum TCAD simulations","authors":"G. Schrom, V. De, S. Selberherr","doi":"10.1016/S0920-5489(99)92304-8","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":100835,"journal":{"name":"Journal of Technology Computer Aided Design TCAD","volume":"27 1","pages":"1-29"},"PeriodicalIF":0.0000,"publicationDate":"1997-09-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Technology Computer Aided Design TCAD","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1016/S0920-5489(99)92304-8","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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