Deposition and Alignment of Carbon Nanotubes with Dielectrophoresis for Fabrication of Carbon Nanotube Field-Effect Transistors

J. Kimbrough, S. Chance, B. Whitaker, Z. Duncan, Kenneth Davis, Alandria Henderson, Zhigang Xiao, Qunying Yuan, F. Camino
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引用次数: 3

Abstract

Semiconducting carbon nanotubes (CNTs) were dispersed ultrasonically in the Nmethyl-2-pyrrolidone (NMP) solvent, and were aligned and patterned with the alternating electric field-directed dielectrophoresis (DEP) method. CNT transistors were fabricated with the DEP-patterned semiconducting CNTs. Clean room-based micro- and nanofabrication techniques such as UV lithography and lift-off process were used to fabricate the CNT devices. The patterned semiconducting carbon nanotubes and fabricated transistors were imaged using the scanning electron microscope (SEM), and the current-voltage (IV) curves were obtained. It was found that the gap between the opposite electrodes affected the patterning of CNTs in the DEP process; the CNT transistors had excellent current-voltage (IV) curves of p-channel filedeffect transistors with high ratios of on/off source-drain current values, and the semiconducting CNTs could achieve a higher yield in the device fabrication.
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电泳法制备碳纳米管场效应晶体管的沉积与取向研究
将半导体碳纳米管(CNTs)超声分散在n甲基-2-吡咯烷酮(NMP)溶剂中,并用交变电场定向介电泳(DEP)方法对其进行排列和图像化。用depp图像化的半导体碳纳米管制备了碳纳米管晶体管。基于洁净室的微纳米加工技术,如UV光刻和升空工艺,被用于制造碳纳米管器件。利用扫描电子显微镜(SEM)对半导体碳纳米管和晶体管进行了成像,得到了它们的电流-电压曲线。结果表明,相对电极之间的间隙影响了DEP过程中碳纳米管的图案;碳纳米管晶体管具有优异的p沟道文件缺陷晶体管的电流-电压(IV)曲线,具有高的开关源漏电流值比,并且半导体碳纳米管在器件制造中可以实现更高的良率。
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