H. Ebel, R. Svagera, Robert Hobl, W. Kugler, Hung D Nguyen
{"title":"Depth profiling by Xrf with Variable Beam Geometry Applied to Thin Films in the Nanometer Region","authors":"H. Ebel, R. Svagera, Robert Hobl, W. Kugler, Hung D Nguyen","doi":"10.1154/S0376030800023119","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":7518,"journal":{"name":"Advances in x-ray analysis","volume":"7 1","pages":"675-682"},"PeriodicalIF":0.0000,"publicationDate":"1995-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Advances in x-ray analysis","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1154/S0376030800023119","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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