The Effect of Initial Connector Insertions on Electrical Contact Resistance

R. Jackson, W. Ashurst, G. Flowers, S. Angadi, S. Choe, M. Bozack
{"title":"The Effect of Initial Connector Insertions on Electrical Contact Resistance","authors":"R. Jackson, W. Ashurst, G. Flowers, S. Angadi, S. Choe, M. Bozack","doi":"10.1109/HOLM.2007.4318189","DOIUrl":null,"url":null,"abstract":"This work attempts to quantify the effect of repeated initial connector insertions and roughness on electrical contact resistance. Experimental measurements show that the electrical contact resistance increases measurably with repeated insertions. They also show that with repeated insertions the connector spring is plastically deformed, thus causing the force closing the contact across the surfaces to decrease. A multi-scale rough surface contact model was used to estimate the actual electrical contact resistance (ECR) versus applied force curve of the connector. As expected, the multiscale ECR model predicts that the ECR will decrease with applied force. Since the contact force decreases with each insertion of the connector due to plastic deformation, the model will predict that the ECR will also increase with each insertion. When the added resistance from a measurable layer of tin oxide is included, the multiscale ECR model shows fairly good agreement with the experimental measurements.","PeriodicalId":11624,"journal":{"name":"Electrical Contacts - 2007 Proceedings of the 53rd IEEE Holm Conference on Electrical Contacts","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2007-09-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"13","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Electrical Contacts - 2007 Proceedings of the 53rd IEEE Holm Conference on Electrical Contacts","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/HOLM.2007.4318189","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 13

Abstract

This work attempts to quantify the effect of repeated initial connector insertions and roughness on electrical contact resistance. Experimental measurements show that the electrical contact resistance increases measurably with repeated insertions. They also show that with repeated insertions the connector spring is plastically deformed, thus causing the force closing the contact across the surfaces to decrease. A multi-scale rough surface contact model was used to estimate the actual electrical contact resistance (ECR) versus applied force curve of the connector. As expected, the multiscale ECR model predicts that the ECR will decrease with applied force. Since the contact force decreases with each insertion of the connector due to plastic deformation, the model will predict that the ECR will also increase with each insertion. When the added resistance from a measurable layer of tin oxide is included, the multiscale ECR model shows fairly good agreement with the experimental measurements.
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
初始连接器插入对电接触电阻的影响
这项工作试图量化重复初始连接器插入和粗糙度对电接触电阻的影响。实验测量表明,随着重复插入,电接触电阻显著增加。他们还表明,随着重复插入,连接器弹簧会发生塑性变形,从而导致关闭接触面的力减小。采用多尺度粗糙表面接触模型估计了连接器的实际接触电阻(ECR)随外力的变化曲线。正如预期的那样,多尺度ECR模型预测ECR会随着施加力的增加而减小。由于接触力随着连接器的每次插入而减少,由于塑性变形,该模型将预测ECR也会随着每次插入而增加。当考虑氧化锡可测层的附加电阻时,多尺度ECR模型与实验结果吻合较好。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
Numerical Analysis of Low-Voltage Circuit-Breakers under Short-Circuit Conditions Influence of Surface Roughness on Contact Voltage Drop of Electrical Sliding Contacts Benchmark Tests of Single-Break and Double-Break Design Principles An Experimental Study of Arc Duration and Transition from Metallic to Gaseous Phase in Ag Alloy Break Arc Thermal Analysis of Sealed Electromagnetic Relays Using 3-D Finite Element Method
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1