{"title":"Techniques for improving the efficiency of sequential circuit test generation","authors":"X. Lin, I. Pomeranz, S. Reddy","doi":"10.1109/ICCAD.1999.810639","DOIUrl":null,"url":null,"abstract":"New techniques are presented in this paper to improve the efficiency of a test generation procedure for synchronous sequential circuits. These techniques aid the test generation procedure by reducing the search space, carrying out non-chronological backtracking, and reusing the test generation effort. They have been integrated into an existing sequential test generation system MIX to constitute a new system, named MIX-PLUS. The experimental results for the ISCAS-89 and ADDENDUM-93 benchmark circuits demonstrate the effectiveness of these techniques in improving the fault coverage and test generation efficiency.","PeriodicalId":6414,"journal":{"name":"1999 IEEE/ACM International Conference on Computer-Aided Design. Digest of Technical Papers (Cat. No.99CH37051)","volume":"23 1","pages":"147-151"},"PeriodicalIF":0.0000,"publicationDate":"1999-11-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"39","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"1999 IEEE/ACM International Conference on Computer-Aided Design. Digest of Technical Papers (Cat. No.99CH37051)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICCAD.1999.810639","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 39
Abstract
New techniques are presented in this paper to improve the efficiency of a test generation procedure for synchronous sequential circuits. These techniques aid the test generation procedure by reducing the search space, carrying out non-chronological backtracking, and reusing the test generation effort. They have been integrated into an existing sequential test generation system MIX to constitute a new system, named MIX-PLUS. The experimental results for the ISCAS-89 and ADDENDUM-93 benchmark circuits demonstrate the effectiveness of these techniques in improving the fault coverage and test generation efficiency.
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