K. Maekawa, H. Makiyama, Yoshiki Yamamoto, T. Hasegawa, S. Okanishi, K. Sonoda, H. Shinkawata, T. Yamashita, S. Kamohara, Y. Yamaguchi
{"title":"Comprehensive Analysis of Low-frequency Noise Variability Components in Bulk and FDSOI (SOTB) MOSFETs","authors":"K. Maekawa, H. Makiyama, Yoshiki Yamamoto, T. Hasegawa, S. Okanishi, K. Sonoda, H. Shinkawata, T. Yamashita, S. Kamohara, Y. Yamaguchi","doi":"10.7567/SSDM.2017.E-1-02","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":22504,"journal":{"name":"The Japan Society of Applied Physics","volume":"96 1","pages":""},"PeriodicalIF":0.0000,"publicationDate":"2017-07-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"The Japan Society of Applied Physics","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.7567/SSDM.2017.E-1-02","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}