{"title":"Reliability Assessment of Tiny Machine Learning Algorithms in the Presence of Control Flow Errors","authors":"B. Eubanks, A. Patooghy, Olcay Kursun","doi":"10.1109/MWSCAS47672.2021.9531793","DOIUrl":null,"url":null,"abstract":"With the advances in hardware technologies, embedded and Edge devices are now able to offer sufficient memory and computational power to accommodate light-weight machine-learning (ML) classifiers. However, due to the intensive code optimization and summarization in the design phase, the reliability of light-weight ML applications is at risk. In this paper, we study the reliability of three prototypical light-weight ML applications against the well-known control flow (CF) errors. We have injected a total of 66,156 CF errors into Bonsai, ProtoNN, and TensorFlow Lite ML applications running on the Arduino board. Based on the results obtained from the error-injections, we found that CF errors could affect either the functionality or the classification accuracy of the ML-based inference as the embedded application. We conclude that making a single decision only after a long sequence of computations/branches may be more error-prone. This issue can be addressed by combining the inferences of intermediate nodes in the chain to obtain the final classification decision.","PeriodicalId":6792,"journal":{"name":"2021 IEEE International Midwest Symposium on Circuits and Systems (MWSCAS)","volume":"24 1","pages":"50-54"},"PeriodicalIF":0.0000,"publicationDate":"2021-08-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2021 IEEE International Midwest Symposium on Circuits and Systems (MWSCAS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MWSCAS47672.2021.9531793","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
With the advances in hardware technologies, embedded and Edge devices are now able to offer sufficient memory and computational power to accommodate light-weight machine-learning (ML) classifiers. However, due to the intensive code optimization and summarization in the design phase, the reliability of light-weight ML applications is at risk. In this paper, we study the reliability of three prototypical light-weight ML applications against the well-known control flow (CF) errors. We have injected a total of 66,156 CF errors into Bonsai, ProtoNN, and TensorFlow Lite ML applications running on the Arduino board. Based on the results obtained from the error-injections, we found that CF errors could affect either the functionality or the classification accuracy of the ML-based inference as the embedded application. We conclude that making a single decision only after a long sequence of computations/branches may be more error-prone. This issue can be addressed by combining the inferences of intermediate nodes in the chain to obtain the final classification decision.
随着硬件技术的进步,嵌入式和边缘设备现在能够提供足够的内存和计算能力,以适应轻量级机器学习(ML)分类器。然而,由于在设计阶段进行密集的代码优化和总结,轻量级ML应用程序的可靠性面临风险。在本文中,我们研究了三种典型的轻量级机器学习应用程序对众所周知的控制流(CF)错误的可靠性。我们已经在Arduino板上运行的Bonsai, ProtoNN和TensorFlow Lite ML应用程序中注入了总共66156个CF错误。基于错误注入的结果,我们发现CF错误可能会影响基于ml的推理作为嵌入式应用程序的功能或分类精度。我们得出的结论是,只有在经过长时间的计算/分支后才做出单一决定可能更容易出错。这个问题可以通过结合链中中间节点的推断来解决,从而得到最终的分类决策。