Test time reduction with SATOM: Simultaneous AC-DC Test with Orthogonal Multi-excitations

Abstract

Test time controls the competitiveness and viability of new precision products in two fundamental ways: it determines final test cost which is a major part of the recurring manufacturing cost, and it determines characterization test time which directly adds to time to market. This paper introduces a new test strategy aimed at dramatically reducing test time for precision analog and mixed signal products. The strategy is termed SATOM for Simultaneous AC-DC Test with Orthogonal Multi-excitations. In SATOM, a device under test is excited with multiple mutually-orthogonal stimulus signals that are simultaneously applied at different input points of the device. A single set of response data is acquired and an intelligent processing algorithm is used to simultaneously compute multiple AC and DC test specifications for the device. This results in a reduction of well over 90% in test time for those specs, with no negative impact on test coverage and test accuracy. Extensive measurement results demonstrated effectiveness, efficiency and robustness of the new method.