Macroscopic and microscopic interface adhesion strength of copper damascene interconnects

N. Shishido, S. Kamiya, C. Chen, H. Sato, K. Koiwa, M. Omiya, M. Nishida, T. Suzuki, T. Nakamura, T. Nokuo
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引用次数: 2

Abstract

Macroscopic and microscopic adhesion strength of damascene interconnects was investigated by evaluating local strength through delaminating different scales of adhesion area under SEM observation. Macroscopic strength obtained by the areas larger than the copper grain was almost constant after considering the macroscopic plastic deformation. However, microscopic strength obtained by the areas smaller than the copper grain spread around the macroscopic strength and was highly sensitive to the copper grain structure, especially the grain boundary.
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大马士革铜互连线宏观和微观界面粘附强度
通过扫描电镜观察不同尺度的附着区域分层,评价局部强度,研究了大马士革互连体的宏观和微观粘附强度。考虑宏观塑性变形后,大于铜晶粒的区域获得的宏观强度基本不变。然而,小于铜晶粒的区域获得的微观强度分布在宏观强度周围,并且对铜晶粒结构,特别是晶界高度敏感。
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