P. Wohl, J. Waicukauski, Frederic Neuveux, Gregory A. Maston, Nadir Achouri, J. E. Colburn
{"title":"Two-level compression through selective reseeding","authors":"P. Wohl, J. Waicukauski, Frederic Neuveux, Gregory A. Maston, Nadir Achouri, J. E. Colburn","doi":"10.1109/TEST.2013.6651896","DOIUrl":null,"url":null,"abstract":"As scan compression becomes ubiquitous, ever more complex designs require higher compression. This paper presents a novel, two-level compression system for scan input data generated by deterministic test generation. First, load care bits and X-control input data are encoded into PRPG seeds; next, seeds are selectively shared for further compression. The latter exploits the hierarchical nature of large designs with tens or hundreds of PRPGs. The system comprises a new architecture, which includes a simple instruction-decode unit, and new algorithms embedded into ATPG. Results on large industrial designs demonstrate significant data and cycle compression increases while maintaining test coverage and performance.","PeriodicalId":6379,"journal":{"name":"2013 IEEE International Test Conference (ITC)","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2013-03-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2013 IEEE International Test Conference (ITC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/TEST.2013.6651896","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 4
Abstract
As scan compression becomes ubiquitous, ever more complex designs require higher compression. This paper presents a novel, two-level compression system for scan input data generated by deterministic test generation. First, load care bits and X-control input data are encoded into PRPG seeds; next, seeds are selectively shared for further compression. The latter exploits the hierarchical nature of large designs with tens or hundreds of PRPGs. The system comprises a new architecture, which includes a simple instruction-decode unit, and new algorithms embedded into ATPG. Results on large industrial designs demonstrate significant data and cycle compression increases while maintaining test coverage and performance.